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S.S. Mani
Observed names:
S. Mani,
S. S. Mani
Institutions:
Sandia National Laboratories California,
Sandia National Laboratories
Observed institutions:
Sandia National Laboratories California,
Northrop Grumman (United States),
Sandia National Laboratories
ORCID:
0000-0002-0732-357X
Observed ORCID:
0000-0002-0732-357X
OpenAlex ID:
A5033849517
Effect of W coating on microengine performance
2002
·
S.S. Mani
, J.G. Fleming
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
25
Hall Mobility of the Electron Inversion Layer in 6H-SiC MOSFETs
2000
·
N.S. Saks
, S.S. Mani
, et al.
·
Materials science forum
·
22
SiC Epitaxial Layer Growth in a Novel Multi-Wafer VPE Reactor
1998
·
Albert A. Burk
, Michael J. O'Loughlin
, et al.
·
Materials science forum
·
16
Pin-joint design effect on the reliability of a polysilicon microengine
2003
·
D.M. Tanner
, J.A. Walraven
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
10
Investigation of Lateral RESURF, 6H-SiC MOSFETs
2000
·
Anant K. Agarwal
, N.S. Saks
, et al.
·
Materials science forum
·
7
Chemical Vapor Deposition Coating for Micromachines
2000
·
S. S. Mani
, J. G. Fleming
, et al.
·
MRS Proceedings
·
6
PDF
Fabrication and Characterization of Large-Area 3-D Photonic Crystals
2006
·
F.B. McCormick
, J.G. Fleming
, et al.
·
IEEE Aerospace Conference (AERO)
·
5
Interface Trap Profiles Near the Band Edges in 6H-SiC MOSFETs
2000
·
N.S. Saks
, S.S. Mani
, et al.
·
Materials science forum
·
5
Experimental demonstration of using nanophotonic crystal sensor systems for submicron damage detection, quantification, and diagnoses
2006
·
J. C. Verley
, S. S. Mani
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
Integrated Microsystems for Microfluidics/BioMEMS: Cellular Sample Handling and Analysis
2002
·
M. Okandan
, P. Galambos
, et al.
·
Solid-State Sensors, Actuators, and Microsystems Workshop (Hilton Head Workshop)
PDF
An acousto-optic tunable filter enhanced CO{sub 2} lidar atmospheric monitor
1996
·
Lyle H. Taylor
, Dennis R. Suhre
, et al.
·
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
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Works count:
11
Citation count:
99
H-index:
6
I10-index:
4
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