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Frank Saurenbach
Observed names:
F Saurenbach,
F. SAURENBACH,
F. Saurenbach,
Saurenbach, F.
Observed institutions:
Forschungszentrum Jülich,
IBM Research - Almaden,
IBM Research - Thomas J. Watson Research Center,
University of Duisburg-Essen,
Technische Universität Braunschweig
OpenAlex ID:
A5034527106
Enhanced magnetoresistance in layered magnetic structures with antiferromagnetic interlayer exchange
1989
·
G. Binasch
, P. Grünberg
, et al.
·
Physical review. B, Condensed matter
·
4,318
Imaging of ferroelectric domain walls by force microscopy
1990
·
F. Saurenbach
, B. D. Terris
·
Applied Physics Letters
·
239
Force microscopy of ion-containing polymer surfaces: morphology and charge structure
1992
·
F. Saurenbach
, D. Wollmann
, et al.
·
Langmuir
·
104
Layered magnetic structures: antiferromagnetic type interlayer coupling and magnetoresistance due to antiparallel alignment
1991
·
P. Grünberg
, J. Barnas
, et al.
·
Journal of Magnetism and Magnetic Materials
·
91
Static and dynamic magnetic properties of Fe-Cr-layered structures with antiferromagnetic interlayer exchange
1988
·
F. Saurenbach
, U. Walz
, et al.
·
Journal of Applied Physics
·
71
Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopy
1993
·
C Bohm
, F Saurenbach
, et al.
·
Journal of Physics D Applied Physics
·
48
PDF
Read-out of micromechanical cantilever sensors by phase shifting interferometry
2005
·
M. Helm
, J. J. Servant
, et al.
·
Applied Physics Letters
·
41
Electrostatic writing and imaging using a force microscope
1992
·
F. Saurenbach
, B.D. Terris
·
IEEE Transactions on Industry Applications
·
37
Spin waves and magnetoresistance in exchange coupled layered magnetic structures
1989
·
F. Saurenbach
, J. Barnas´
, et al.
·
Thin Solid Films
·
37
Piezoresistive sensors on AFM cantilevers with atomic resolution
1998
·
R. Jumpertz
, A.v.d. Hart
, et al.
·
Microelectronic Engineering
·
36
Exchange coupling of ferromagnetic films across nonmagnetic interlayers
1987
·
P. Swiatek
, F. Saurenbach
, et al.
·
Journal of Applied Physics
·
33
Readout of micromechanical cantilever sensor arrays by Fabry-Perot interferometry
2007
·
Jana Wehrmeister
, Achim Fuß
, et al.
·
Review of Scientific Instruments
·
17
Electrical characterization of molecular monolayers containing tungsten polyoxometalates
2006
·
Nikos Glezos
, Antonios M. Douvas
, et al.
·
Microelectronic Engineering
·
15
Investigation of spin structure in fcc Fe-Ni-Mn
1986
·
Bernhard Huck
, Frank Saurenbach
, et al.
·
Hyperfine Interactions
·
11
Atomic force microscopy in effusion cytology.
1998
·
B Ross
, H Motherby
, et al.
·
PubMed
·
9
Bridge configuration of piezoresistive devices for scanning force microscopes
1998
·
R. Jumpertz
, J. Schelten
, et al.
·
Sensors and Actuators A Physical
·
5
Piezoresistive bridge configuration for atomic force microscopy
1997
·
R. Jumpertz
, A. van der Hart
, et al.
·
European Solid-State Device Research Conference
·
1
Electrostatic writing and imaging using a force microscope
2002
·
F. Saurenbach
, B.D. Terris
·
IEEE Industry Applications Society Annual Meeting (IAS)
ChemInform Abstract: Layered Magnetic Structures: Antiferromagnetic Type Interlayer Coupling and Magnetoresistance Due to Antiparallel Alignment
1991
·
P. GRUENBERG
, J. BARNAS
, et al.
·
ChemInform
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Works count:
20
Citation count:
5,113
H-index:
13
I10-index:
14
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