Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Marcel van Dijk
Observed name:
van Dijk, Marcel
Institution:
VSL National Metrology Institute
Observed institution:
VSL National Metrology Institute
ORCID:
0000-0003-4038-8241
Observed ORCID:
0000-0003-4038-8241
OpenAlex ID:
A5034626034
A Shared Metrological Framework for Trustworthy Virtual Experiments and Digital Twins
2024
·
Giacomo Maculotti
, Manuel Marschall
, et al.
·
Metrology
·
25
PDF
Measurement Uncertainty Evaluation for Sensor Network Metrology
2025
·
Peter Harris
, Peter Friis Østergaard
, et al.
·
Metrology
·
22
PDF
Sensor network metrology: Current state and future directions
2025
·
Shahin Tabandeh
, Anupam Prasad Vedurmudi
, et al.
·
Measurement Sensors
·
19
Using a Multivariate Virtual Experiment for Uncertainty Evaluation with Unknown Variance
2024
·
Manuel Marschall
, Finn Hughes
, et al.
·
Metrology
·
12
PDF
Virtual experiments for the assessment of data analysis and uncertainty quantification methods in scatterometry
2023
·
Gertjan Kok
, Marcel van Dijk
, et al.
·
Metrologia
·
11
JCGM 101-compliant uncertainty evaluation using virtual experiments
2025
·
Finn Hughes
, Manuel Marschall
, et al.
·
Measurement Sensors
·
9
Comparison of uncertainty evaluation methods for virtual experiments with an application to a virtual CMM
2025
·
Marcel van Dijk
, Gertjan Kok
·
Measurement Sensors
·
9
Modelling and determining correlations in sensor networks
2025
·
Gertjan Kok
, Marcel van Dijk
, et al.
·
Measurement Sensors
·
6
Measurement Uncertainty Evaluation: Differences Between Virtual Experiments and the Standardized Approach
2025
·
Gertjan Kok
, Marcel van Dijk
·
Metrology
·
5
PDF
Good practice in sensor network metrology
2026
·
Pearce, Jonathan
, Harris, Peter
, et al.
·
Zenodo (CERN European Organization for Nuclear Research)
NEWSTAND App
2026
·
Hinken, David
, Brinkmann, Malte
, et al.
·
Zenodo (CERN European Organization for Nuclear Research)
Metrological Validation of a Digital Model for a CMM including Digital Bias Correction
2025
·
Marcel van Dijk
, Walter Knulst
, et al.
·
IMEKO TC6 Conference on Digitalization (M4DConf)
PDF
Forecasting the implied volatility surface in risk-management applications
2017
·
Marcel van Dijk
·
Research Repository (Delft University of Technology)
PDF
Show more works
View as search
Works count:
14
Citation count:
118
H-index:
7
I10-index:
5
Year
Topic
Type