Author

Yelim Jeon

Observed names: Y. Jeon, Yu Yeong Jeon

Institutions: Sogang University, Samsung Electronics (South Korea)

Observed institutions: Sogang University, Kongju National University, Samsung Electronics (South Korea), The University of Texas at Austin

ORCID: 0009-0009-3207-3961

Observed ORCID: 0009-0009-3207-3961

OpenAlex ID: A5034700023

MOSFET devices with polysilicon on single-layer HfO/sub 2/ high-K dielectrics

2002 · L. Kang, K. Onishi, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 74

Effect of flame‐retardant melamine and dispersants on the mechanical, thermal, and foaming properties of flexible polyurethane foam

2023 · Yu Yeong Jeon, Euy Sik Jeon, et al. · Fire and Materials · 4

Optimization of Cross-Bridge Kelvin Resistor (CBKR) Layout for the Precise Contact Resistance Measurement of TiSi2/n+ Si

2025 · Hyungju Noh, Changmin Chae, et al. · Electronics · 1

Rigorous analysis on the operating mechanism of gate-injection ferroelectric flash

2025 · Yelim Jeon, Hyungju Noh, et al. · Solid-State Electronics

Fabrication and characterization of PZT thick films on silicon substrates

1999 · Kwangsoo No, Yu Yeong Jeon, et al.

Works count: 5

Citation count: 79

H-index: 2

I10-index: 1