Get started
Author

Shankhamitra Sunani

ORCID: 0009-0008-5084-4718
Observed ORCID: 0009-0008-5084-4718
OpenAlex ID: A5035494246
Comparative analysis of single and triple material 10 nm Tri-gate FinFET
2024 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · Journal of the Korean Physical Society · 14
Design and Analysis of Gate-Stack 7 nm node Tri-gate FinFET for low power Application
2023 · Manaswini Mishra, Ananya Dastidar, et al. · International Conference on Circuits, Power and Intelligent Systems (CCPIS) · 3
Design and Performance Analysis of Single Material and Triple Material Cylindrical Gate All Around Gate Stack Silicon Nanowire FET at 7 nm Technology node
2025 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · IEEE India Council International Subsections Conference (INDISCON) · 2
A simulation study of 7 nm Si-based Multiple Gate Material Nanosheet Field Effect Transistors
2025 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · Semiconductors · 2
Erratum: Comparative analysis of single and triple material 10 nm Tri-gate FinFET
2024 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · Journal of the Korean Physical Society · 1
PDF
Design and Analysis of Gate Stack 7 nm Triple Material Gate Nanosheet FET for Low-Power Application
2026 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · Lecture notes in electrical engineering
Temperature, Work Function, and Doping Effect on Performance of Si/GaN-based Sub-10 nm Gate-stack Cylindrical GAA-SMG High Frequency FET
2026 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · Silicon
Design & Analysis of Si Gate All Around (GAA) FET with Si-Based Spacers and Source/Drain Underlap at 7 Nm Node
2026 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · International Conference on Artificial Intelligence & Machine Learning in Communication and Power Systems (AIMLCPS)
Design and Analysis of 7Nm SMG GaN Nanosheet FET Under Temperature, Doping, and Work Function Effect
2026 · Shankhamitra Sunani, Satya Sopan Mahato, et al. · International Conference on Artificial Intelligence & Machine Learning in Communication and Power Systems (AIMLCPS)
The Reliability Evaluation of Cube Based Interconnection Networks Under Node Failure Model
2015 · Nalin Kanta Barpanda, Shankhamitra Sunani, et al. · Research Journal of Information Technology & Software Management
Works count: 10
Citation count: 22
H-index: 2
I10-index: 1
Year
Topic
Type