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Daniel Arumí

Observed names: Arumi Delgado, Daniel, Arumí, Daniel, D. Arumi, D. Arumi-Delgado, D. Arumí, D. Arumí, Daniel Arumi, Daniel Arumi Delgado, Daniel Arumí i Delgado
ORCID: 0000-0002-6638-7485
Observed ORCID: 0000-0002-6638-7485
OpenAlex ID: A5035927570
Experimental Characterization of CMOS Interconnect Open Defects
2007 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 57
Defective Behaviours of Resistive Opens in Interconnect Lines
2005 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE European Test Symposium (ETS) · 42
Unpredictable Bits Generation Based on RRAM Parallel Configuration
2018 · Daniel Arumi, Alvaro Gomez-Pau, et al. · IEEE Electron Device Letters · 31
Diagnosis of Full Open Defects in Interconnecting Lines
2007 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE VLSI Test Symposium (VTS) · 26
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs
2023 · Maryam Akbari, Sattar Mirzakuchaki, et al. · IEEE Access · 20
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Design and validation of a platform for electromagnetic fault injection
2017 · Josep Balasch, Daniel Arumi, et al. · Conference on Design of Circuits and Integrated Systems · 20
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RRAM Random Number Generator Based on Train of Pulses
2021 · Binbin Yang, Daniel Arumí, et al. · Electronics · 16
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A forming-free ReRAM cell with low operating voltage
2020 · Binbin Yang, Nuo Xu, et al. · IEICE Electronics Express · 16
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Post-bond test of Through-Silicon Vias with open defects
2014 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE European Test Symposium (ETS) · 16
Postbond Test of Through-Silicon Vias With Resistive Open Defects
2019 · Rosa Rodriguez-Montanes, Daniel Arumi, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 15
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Prebond Testing of Weak Defects in TSVs
2015 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 15
Full Open Defects in Nanometric CMOS
2008 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE VLSI Test Symposium (VTS) · 15
RRAM serial configuration for the generation of random bits
2017 · D. Arumí, M.B. Gonzalez, et al. · Microelectronic Engineering · 12
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Impact of gate tunnelling leakage on CMOS circuits with full open defects
2007 · R. Rodríguez-Montañés, D. Arumí, et al. · Electronics Letters · 12
RRAM based random bit generation for hardware security applications
2016 · Daniel Arumi, Salvador Manich, et al. · Conference on Design of Circuits and Integrated Systems · 11
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Localization and Electrical Characterization of Interconnect Open Defects
2010 · Rosa Rodriguez-Montanes, Daniel Arumi, et al. · IEEE Transactions on Semiconductor Manufacturing · 11
True Random Number Generator Based on RRAM-Bias Current Starved Ring Oscillator
2023 · D. Arumí, S. Manich, et al. · IEEE Journal on Exploratory Solid-State Computational Devices and Circuits · 10
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Delay caused by resistive opens in interconnecting lines
2008 · D. Arumí, R. Rodríguez-Montañés, et al. · Integration · 10
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages
2007 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE VLSI Test Symposium (VTS) · 9
I DDQ -based diagnosis at very low voltage (VLV) for bridging defects
2007 · D. Arumi, R. Rodríguez-Montañés, et al. · Electronics Letters · 9
Effectiveness of very low voltage testing of bridging defects
2006 · R. Rodríguez-Montañés, D. Arumí, et al. · Electronics Letters · 9
Impact of Laser Attacks on the Switching Behavior of RRAM Devices
2020 · Daniel Arumí, Salvador Manich, et al. · Electronics · 8
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Gate Leakage Impact on Full Open Defects in Interconnect Lines
2010 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 8
Diagnosis of full open defects in interconnect lines with fan-out
2010 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE European Test Symposium (ETS) · 8
Serial RRAM Cell for Secure Bit Concealing
2021 · Binbin Yang, Daniel Arumí, et al. · Electronics · 6
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Works count: 55
Citation count: 472
H-index: 12
I10-index: 18
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