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Richard J. Stamp
Observed names:
R. J. Stamp,
R. Stamp,
R.J. Stamp,
Richard J Stamp,
Richard Stamp,
Stamp, R.
show all 6
Observed institution:
University of the West of England
OpenAlex ID:
A5036268494
C-AFM-based thickness determination of thin and ultra-thin SiO 2 films by use of different conductive-coated probe tips
2006
·
Werner Frammelsberger
, Guenther Benstetter
, et al.
·
Applied Surface Science
·
103
An online robot trajectory planning and programming support system for industrial use
2012
·
C. Kohrt
, R. Stamp
, et al.
·
Robotics and Computer-Integrated Manufacturing
·
56
Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy
2005
·
Werner Frammelsberger
, Guenther Benstetter
, et al.
·
Applied Surface Science
·
54
Automated inspection of textured ceramic tiles
2000
·
Melvyn L Smith
, Richard J Stamp
·
Computers in Industry
·
51
Mathematical modelling of influence functions in computer-controlled polishing: Part I
2007
·
Markus Schinhaerl
, Gordon Smith
, et al.
·
Applied Mathematical Modelling
·
48
PDF
Mathematical modelling of influence functions in computer-controlled polishing: Part II
2007
·
Markus Schinhaerl
, Gordon Smith
, et al.
·
Applied Mathematical Modelling
·
47
PDF
Utilisation of time-variant influence functions in the computer controlled polishing
2007
·
Markus Schinhaerl
, Rolf Rascher
, et al.
·
Precision Engineering
·
40
Filter algorithm for influence functions in the computer controlled polishing of high-quality optical lenses
2006
·
Markus Schinhaerl
, Rolf Rascher
, et al.
·
International Journal of Machine Tools and Manufacture
·
22
Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations
2004
·
Werner Frammelsberger
, Guenther Benstetter
, et al.
·
Materials Science and Engineering B
·
17
Forces acting between polishing tool and workpiece surface in magnetorheological finishing
2008
·
Markus Schinhaerl
, Christian Vogt
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
15
Simulation of a complex optical polishing process using a neural network
2007
·
Elmar Pitschke
, Markus Schinhaerl
, et al.
·
Robotics and Computer-Integrated Manufacturing
·
13
Comparison of different magnetorheological polishing fluids
2005
·
Markus Schinhaerl
, Elmar Pitschke
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
11
Advanced techniques for computer-controlled polishing
2008
·
Markus Schinhaerl
, Richard Stamp
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
9
Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy
2003
·
Werner Frammelsberger
, Guenther Benstetter
, et al.
·
Microelectronics Reliability
·
9
Coherences between influence function size, polishing quality, and process time in magnetorheological finishing
2006
·
Markus Schinhaerl
, Andreas Geiss
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
8
PDF
Temporal stability and performance of MR polishing fluid
2004
·
Markus Schinhaerl
, Elmar G. Pitschke
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
8
Calculation of MRF influence functions
2007
·
Markus Schinhaerl
, Gordon Smith
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
7
Prediction of MRF polishing by classification of the initial error with Zernike polynomials
2004
·
Elmar Pitschke
, Peter Sperber
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
6
A robot manipulator communications and control framework
2008
·
Christian Kohrt
, Anthony Pipe
, et al.
·
IEEE International Conference on Mechatronics and Automation (ICMA)
·
4
New viscosity measurement for magnetorheological polishing fluid
2005
·
Markus Schinhaerl
, Elmar Pitschke
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Nonholonomic Motion Planning by Means of Particles
2006
·
C. Kohrt
, G. Schiedermeier
, et al.
·
International Conference on Mechatronics and Automation
·
3
A simple procedure to include a free-form measurement capability to standard coordinate measurement machines
2013
·
Florian Schneider
, Rolf Rascher
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
A cell based voronoi roadmap for motion planning of articulated robots using movement primitives
2012
·
C. Kohrt
, A. G. Pipe
, et al.
·
IEEE International Conference on Robotics and Biomimetics (ROBIO)
·
2
Combined AFM methods to improve reliability investigations of thin oxides
2003
·
W. Frammelsberger
, G. Benstetter
, et al.
·
IEEE International Integrated Reliability Workshop final report
·
2
Lens production enhancement by adoption of artificial influence functions and a knowledge-based system in a magnetorheological finishing process
2007
·
Elmar Pitschke
, Peter Sperber
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
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Works count:
40
Citation count:
547
H-index:
11
I10-index:
12
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