Author

A. Chand

Observed name: Aditya Chand

Observed institutions: MIT World Peace University, Indian Institute of Technology Delhi, Veeco (United States)

ORCID: 0009-0001-5591-2205

Observed ORCID: 0009-0001-5591-2205

OpenAlex ID: A5036293226

Tip characterization and surface reconstruction of complex structures with critical dimension atomic force microscopy

2005 · G. Dahlen, M. Osborn, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 71

Microfabricated small metal cantilevers with silicon tip for atomic force microscopy

2000 · A. Chand, M.B. Viani, et al. · Journal of Microelectromechanical Systems · 47

C-V characterization of MOS capacitors in SOI structures

1996 · S.C. Rustagi, Z.O. Mohsen, et al. · Solid-State Electronics · 11

Bio-mechanical analysis of porous Ti-6Al-4V scaffold: a comprehensive review on unit cell structures in orthopaedic application

2024 · Sachin Deshmukh, Aditya Chand, et al. · Biomedical Physics & Engineering Express · 3

Rapid Thermal Processing for Improved Polysilicon Soi Nmosfets

2005 · A. Chand, S. Chandra, et al. · Proceedings - IEEE International SOI Conference/Proceedings

Small cantilevers for atomic force microscopy and force spectroscopy of biological molecules

1998 · Mario Viani, Tilman E. Schäffer, et al. · APS March Meeting Abstracts

Works count: 6

Citation count: 132

H-index: 3

I10-index: 3