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Matthias Eberlein

Observed names: Eberlein, Matthias, M. Eberlein
ORCID: 0000-0002-6188-8029
Observed ORCID: 0000-0002-6188-8029
OpenAlex ID: A5036326187
An 8b subthreshold hybrid thermal sensor with ±1.07°C inaccuracy and single-element remote-sensing technique in 22nm FinFET
2018 · Cho-Ying Lu, Surej Ravikumar, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 65
A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements
2019 · M. Eberlein, H. Pretl · IEEE Solid-State Circuits Letters · 47
A 28nm CMOS ultra-compact thermal sensor in current-mode technique
2016 · Matthias Eberlein, Idan Yahav · Symposium on VLSI Circuits · 35
A 40nW, Sub-IV Truly ‘Digital’ Reverse Bandgap Reference Using Bulk-Diodes in 16nm FinFET
2018 · Matthias Eberlein, Georgios Panagopoulos, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 21
Fifty Nifty Variations of Two-Transistor Circuits: A tribute to the versatility of MOSFETs
2021 · Harald Pretl, Matthias Eberlein · IEEE Solid-State Circuits Magazine · 11
A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements
2019 · M. Eberlein, H. Pretl · European Solid-State Circuits Conference (ESSCIRC) · 11
Live demonstration: Dynamic voltage and frequency scaling for neuromorphic many-core systems
2017 · Sebastian Hoppner, Yexin Yan, et al. · IEEE International Symposium on Circuits and Systems proceedings · 7
A Current-Mode Temperature Sensor with a ±1.56 °C Raw Error and Duty-Cycle Output in 16nm FinFET
2021 · Matthias Eberlein, Harald Pretl · IEEE International Symposium on Circuits and Systems proceedings · 6
Time-Controlled and FinFET Compatible Sub-Bandgap References Using Bulk-Diodes
2019 · M. Eberlein, H. Pretl, et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 5
A technology compensated current reference in standard CMOS
2007 · Matthias Eberlein · IEEE International Conference on ASIC (ASICON) · 5
Recent Developments in Bandgap References for Nanometer CMOS Technologies
2020 · Matthias Eberlein, Harald Pretl · Austrochip Workshop on Microelectronics (Austrochip) · 4
A Low-Noise Sub-Bandgap Reference with a ±0.64% Untrimmed Precision in 16nm FinFET
2019 · Matthias Eberlein, Harald Pretl · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 4
A Time-Domain Temperature Sensor using Nwell Diodes on 820µm^2 in 7nm FinFET
2019 · Matthias Eberlein, Harald Pretl, et al. · Austrochip Workshop on Microelectronics (Austrochip) · 4
A 0.6V Supply Ultra-Compact Voltage Reference Exploiting MOS Threshold Correlations
2025 · Matthias Eberlein, Sebastian Ruping · Custom Integrated Circuits Conference · 2
A Compact Thermal Sensor with Duty-Cycle Modulation on 1200 µm2 in 7nm FinFET
2021 · Matthias Eberlein, Harald Pretl · International Symposium on VLSI Design, Automation and Test · 1
An integrated channel noise-based true random number generator
2007 · Matthias Eberlein, Rosnany Abu Bakar · IEEE International Conference on ASIC (ASICON) · 1
Oven-Controlled Bandgap: A Fully Integrated Temperature and Voltage Reference
2026 · Matthias Eberlein · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
A sub-1V, 82ppm/K Cryo-CMOS Voltage Reference based on ΔVth in 22nm FDSOI
2026 · Matthias Eberlein, Johannes Weber · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
Thermal Sensor and Reference Circuits Based on a Time-Controlled Bias of pn-Junctions in FinFET Technology
2022 · Matthias Eberlein, Harald Pretl · Springer eBooks
Subthreshold-Hybrid Solutions for Thermal Sensor and Reference Circuits in Advanced CMOS
2020 · Matthias Eberlein, Harald Pretl · IFIP/IEEE International Conference on Very Large Scale Integration
Works count: 23
Citation count: 230
H-index: 7
I10-index: 6
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