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Heiko Müller
Observed names:
H Müller,
H. Müller,
Heiko Muller,
Müller, Heiko
Institution:
Corrected Electron Optical Systems (Germany)
Observed institutions:
Technische Universität Darmstadt,
Corrected Electron Optical Systems (Germany),
RIKEN Center for Emergent Matter Science,
Hitachi (Japan)
OpenAlex ID:
A5037609358
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
2008
·
C. Kisielowski
, B. Freitag
, et al.
·
Microscopy and Microanalysis
·
324
Transmission electron microscopy at 20kV for imaging and spectroscopy
2011
·
U. Kaiser
, J. Biskupek
, et al.
·
Ultramicroscopy
·
202
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV
2016
·
Martin Linck
, Peter Hartel
, et al.
·
Physical Review Letters
·
141
Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration
2010
·
M. Haider
, P. Hartel
, et al.
·
Microscopy and Microanalysis
·
121
Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope
2006
·
Heiko Müller
, Stephan Uhlemann
, et al.
·
Microscopy and Microanalysis
·
118
Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy
2013
·
Stephan Uhlemann
, Heiko Müller
, et al.
·
Physical Review Letters
·
108
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
2007
·
M. Haider
, H. Müller
, et al.
·
Ultramicroscopy
·
102
Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution
2015
·
Tetsuya Akashi
, Yoshio Takahashi
, et al.
·
Applied Physics Letters
·
95
Current and future aberration correctors for the improvement of resolution in electron microscopy
2009
·
M. Haider
, P. Hartel
, et al.
·
Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences
·
86
Chapter 2 Present and Future Hexapole Aberration Correctors for High-Resolution Electron Microscopy
2008
·
Maximilian Haider
, Heiko Müller
, et al.
·
Advances in imaging and electron physics
·
43
Aplanatic imaging systems for the transmission electron microscope
2010
·
Heiko Müller
, Ingo Maßmann
, et al.
·
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
·
38
Mirror corrector for low-voltage electron microscopes
2003
·
P. Hartel
, D. Preikszas
, et al.
·
Advances in imaging and electron physics
·
35
A coherence function approach to image simulation
1998
·
H. Müller
, H. Rose
, et al.
·
Journal of Microscopy
·
35
Test and characterization of a new post-column imaging energy filter
2019
·
Frank Kahl
, Volker Gerheim
, et al.
·
Advances in imaging and electron physics
·
29
Electron nanodiffraction using sharply focused parallel probes
2007
·
Christian Dwyer
, Angus I. Kirkland
, et al.
·
Applied Physics Letters
·
28
In-focus electron microscopy of frozen-hydrated biological samples with a Boersch phase plate
2011
·
B. Barton
, D. Rhinow
, et al.
·
Ultramicroscopy
·
27
Thermal magnetic field noise: Electron optics and decoherence
2014
·
Stephan Uhlemann
, Heiko Müller
, et al.
·
Ultramicroscopy
·
21
Elemental mapping in single-particle reconstructions by reconstructed electron energy-loss analysis
2024
·
Olivia Pfeil-Gardiner
, Higor Vinícius Dias Rosa
, et al.
·
Nature Methods
·
19
Aberration-corrected optics: from an idea to a device
2008
·
Heiko Müller
, Stephan Uhlemann
, et al.
·
Physics Procedia
·
16
PDF
Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond
2006
·
Rolf Erni
, Bert Freitag
, et al.
·
Microscopy and Microanalysis
·
12
On the Benefit of Aberration Correction in Cryo Electron Microscopy
2020
·
Martin Linck
, Heiko Müller
, et al.
·
Microscopy and Microanalysis
·
11
PDF
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV
2021
·
Ryusuke Sagawa
, Akira Yasuhara
, et al.
·
Ultramicroscopy
·
10
Realization of the First Aplanatic Transmission Electron Microscope
2011
·
I Maβmann
, S Uhlemann
, et al.
·
Microscopy and Microanalysis
·
10
A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook
2014
·
Felix Börrnert
, Heiko Müller
, et al.
·
Ultramicroscopy
·
9
On the residual six-fold astigmatism in DCOR/ASCOR
2019
·
P. Hartel
, V. Gerheim
, et al.
·
Ultramicroscopy
·
8
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Works count:
76
Citation count:
1,738
H-index:
18
I10-index:
23
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