Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Rajeewa Kumar Jaisawal
Observed names:
R. K. Jaisawal,
Rajeewa Kumar
Institution:
Government of Uttar Pradesh
Observed institutions:
Indian Institute of Technology Roorkee,
Indian Institute of Information Technology Design and Manufacturing Jabalpur,
Government of Uttar Pradesh
ORCID:
0000-0003-4285-7750
Observed ORCID:
0000-0003-4285-7750
OpenAlex ID:
A5037922981
Design Optimization of Three-Stacked Nanosheet FET From Self-Heating Effects Perspective
2022
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
66
Demonstration of a Nanosheet FET With High Thermal Conductivity Material as Buried Oxide: Mitigation of Self-Heating Effect
2023
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
IEEE Transactions on Electron Devices
·
55
Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET
2022
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
Solid-State Electronics
·
37
Insights into the operation of negative capacitance FinFET for low power logic applications
2021
·
Rajeewa Kumar Jaisawal
, P.N. Kondekar
, et al.
·
Microelectronics Journal
·
37
Assessing the analog/RF and linearity performances of FinFET using high threshold voltage techniques
2022
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
Semiconductor Science and Technology
·
33
PDF
Self-Heating and Interface Traps Assisted Early Aging Revelation and Reliability Analysis of Negative Capacitance FinFET
2023
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
27
Investigation of ambient temperature and thermal contact resistance induced self-heating effects in nanosheet FET
2022
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
Semiconductor Science and Technology
·
26
Reliability of TCAD study for HfO2-doped Negative capacitance FinFET with different Material-Specific dopants
2022
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
Solid-State Electronics
·
21
Role of temperature on linearity and analog/RF performance merits of a negative capacitance FinFET
2022
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
Semiconductor Science and Technology
·
21
PDF
Unveiling the Self-Heating and Process Variation Reliability of a Junctionless FinFET-Based Hydrogen Gas Sensor
2023
·
Navneet Gandhi
, Sunil Rathore
, et al.
·
IEEE Sensors Letters
·
20
Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET
2023
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
Microelectronics Journal
·
19
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET
2023
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
19
A proof of concept for reliability aware analysis of junctionless negative capacitance FinFET-based hydrogen sensor
2024
·
Navneet Gandhi
, Rajeewa Kumar Jaisawal
, et al.
·
Smart Materials and Structures
·
17
PDF
Analog/RF and Linearity Performance Assessment of a Negative Capacitance FinFET Using High Threshold Voltage Techniques
2023
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
IEEE Transactions on Nanotechnology
·
15
Systematic performance benchmarking of nanosheet and FinFET: An intrinsic self-heating perspective
2025
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
Microelectronics Reliability
·
14
Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor
2024
·
Navneet Gandhi
, Sunil Rathore
, et al.
·
IEEE Transactions on Dielectrics and Electrical Insulation
·
14
Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor
2022
·
Sunil Rathore
, Rajeewa Kumar Jaisawal
, et al.
·
Microelectronics Journal
·
14
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor
2023
·
Navneet Gandhi
, Rajeewa Kumar Jaisawal
, et al.
·
Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ...
·
12
Unveiling the reliability of negative capacitance FinFET with confrontation of different HfO2-ferroelectric dopants
2024
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
Solid-State Electronics
·
7
Noise Analysis in FinFET-based Analog Circuit with Technology Scaling
2023
·
Mallikarjun Patil
, Rajeewa Kumar Jaisawal
, et al.
·
Devices for Integrated Circuit (DevIC)
·
5
Demonstration of a Junctionless Negative Capacitance FinFET-based Hydrogen Gas Sensor: A Reliability Perspective
2023
·
Navneet Gandhi
, Rajeewa Kumar Jaisawal
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
5
Revealing the Noise Dependent Sensitivity of a Junctionless FinFET-Based Hydrogen Sensor with Ferroelectric Gate Stack
2024
·
Navneet Gandhi
, Sunil Rathore
, et al.
·
International Conference on Simulation of Semiconductor Processes and Devices
·
3
PDF
Demonstration of a Vertically Stacked Junctionless Forksheet as Dielectric Modulated Biosensor
2024
·
Navneet Gandhi
, Rajeewa Kumar Jaisawal
, et al.
·
International Symposium on VLSI Design and Test (VDAT)
·
3
Role of Interfacial Oxide on Capacitance Matching in a Negative Capacitance FinFET: A Reliability Perspective
2022
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
IEEE International Conference on Emerging Electronics (ICEE)
·
3
Effect of Scaling on Passive Voltage Amplification in FE-DE Hetero Structure
2021
·
Bhaskar Awadhiya
, Pravin N. Kondekar
, et al.
·
International Conference on Control, Automation, Power and Signal Processing (CAPS)
·
3
Show more works
View as search
Works count:
36
Citation count:
503
H-index:
14
I10-index:
18
Year
Topic
Type
