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Jeom‐Jae Kim

Observed names: Jeom-Jae Kim, JeomJae Kim, Jeomjae Kim
OpenAlex ID: A5038082344
Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors
2022 · Sungju Choi, Jingyu Park, et al. · Advanced Electronic Materials · 48
High-Performance Hexagonal Tellurium Thin-Film Transistor Using Tellurium Oxide as a Crystallization Retarder
2022 · Taikyu Kim, Cheol Hee Choi, et al. · IEEE Electron Device Letters · 35
Analysis of Drain-Induced Barrier Lowering in InGaZnO Thin-Film Transistors
2022 · Tae Jun Yang, Je-Hyuk Kim, et al. · IEEE Transactions on Electron Devices · 29
The Significance on Structural Modulation of Buffer and Gate Insulator for ALD Based InGaZnO TFT Applications
2021 · Wan-Ho Choi, Kyoungrok Kim, et al. · IEEE Transactions on Electron Devices · 25
15.4: A Novel High Speed Integrated Gate Driver Circuit using a‐Si TFT for 240Hz FHD LCD TVs
2011 · Hong‐Jae Shin, Mi‐Young Son, et al. · SID Symposium Digest of Technical Papers · 14
4.4L: LateNews Paper : A Novel High Reliable Integrated Gate Driver with BiScanning Structure using aSi TFT for Large Size FHD TFTLCD TVs
2010 · HongJae Shin, ByungHyun Park, et al. · SID Symposium Digest of Technical Papers · 13
Patternization of cathode metal using low surface energy organic molecules in OLED thermal evaporation process
2022 · Seong Keun Kim, Kwan-Soo Kim, et al. · Journal of Industrial and Engineering Chemistry · 12
Preferred Orientation Evolution of Hole Transport Materials for High Emitting Dipole Orientation Ratio of the Emitting Material
2022 · Heui‐Dong Lee, Ho Jin Jang, et al. · Advanced Optical Materials · 9
53‐1: The foldable display architecture technique depending on the wide temperature range and the folding curvature
2022 · Min-Ho Lee, Se-jin Jang, et al. · SID Symposium Digest of Technical Papers · 9
27‐2: Novel LTPS‐TFT Backplane Structure on Glass for 1,443ppi 4.3‐in. AMOLED VR Display
2022 · Kummi Oh, Sun-Wook Ko, et al. · SID Symposium Digest of Technical Papers · 4
64.4: Submicron Pixel Electrode Structure in IPS Mode
2012 · Joon‐Young Yang, Jung‐Il Lee, et al. · SID Symposium Digest of Technical Papers · 4
9‐2: Oxide TFT behavior Under X‐Ray Irradiation in DXD Backplane
2022 · YounGyoung Chang, Youngjin Yi, et al. · SID Symposium Digest of Technical Papers · 3
69‐2: Development of Flexible Cover Window for Large Foldable Display with a Pen‐Touch Function
2021 · Youngjoo Park, Soyeon Bang, et al. · SID Symposium Digest of Technical Papers · 3
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24.2: The IPS‐Mode Panel for High‐Speed Driving
2010 · Young‐Mi Tak, Sun‐Ik Park, et al. · SID Symposium Digest of Technical Papers · 3
P‐14: Effects of Film Density on IGZO Based TFT Device Reliability
2022 · Jaeyoon Park, Yong-Sung Kim, et al. · SID Symposium Digest of Technical Papers · 2
25‐4: Methodology and Correlation of AI‐Based Design for OLED Materials
2021 · Joong-Hwan Yang, Hyong-Jong Choi, et al. · SID Symposium Digest of Technical Papers · 2
40‐4: Double EML Structure for High Efficiency Organic Light Emitting Diode
2022 · Eun-Hyung Lee, Yong-Cheol Kim, et al. · SID Symposium Digest of Technical Papers · 1
Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors (Adv. Electron. Mater. 5/2022)
2022 · Sungju Choi, Jingyu Park, et al. · Advanced Electronic Materials
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IGZO TFT Behavior Under X-Ray Irradiation in DXD Panel
2021 · Youn-Gyoung Chang, Hanseok Lee, et al. · Proceedings of the International Display Workshops
Works count: 19
Citation count: 216
H-index: 9
I10-index: 7
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