Get started
Author

Bappaditya Dey

Observed names: Dey, Bappaditya, bappaditya Dey
Institution: IMEC
ORCID: 0000-0002-0886-137X
Observed ORCID: 0000-0002-0886-137X
OpenAlex ID: A5038571835
Code Generation Using Machine Learning: A Systematic Review
2022 · Enrique Dehaerne, Bappaditya Dey, et al. · IEEE Access · 96
PDF
Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review
2024 · Ying-Lin Chen, Sara Sacchi, et al. · IEEE Transactions on Artificial Intelligence · 52
Deep learning-based defect classification and detection in SEM images
2022 · Bappaditya Dey, Dipam Goswami, et al. · Metrology, Inspection, and Process Control XXXVI · 39
PDF
Deep learning based defect classification and detection in SEM images: a mask R-CNN approach
2022 · Bappaditya Dey, Enrique Dehaerne, et al. · Metrology, Inspection, and Process Control XXXVI · 28
PDF
SEM image denoising with unsupervised machine learning for better defect inspection and metrology
2021 · Bappaditya Dey, Sandip Halder, et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 26
Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review
2025 · Enrique Dehaerne, Bappaditya Dey, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 23
PDF
Optimizing YOLOv7 for semiconductor defect detection
2023 · Enrique Dehaerne, Bappaditya Dey, et al. · Metrology, Inspection, and Process Control XXXVI · 20
PDF
A Novel Design Gate based Low-Cost Configurable RO PUF using Reversible Logic
2019 · Bappaditya Dey, Kasem Khalil, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 20
A Reversible-Logic Based Architecture for Long Short-Term Memory (LSTM) Network
2021 · Kasem Khalil, Bappaditya Dey, et al. · IEEE International Symposium on Circuits and Systems proceedings · 18
A Novel Reconfigurable Hardware Architecture of Neural Network
2019 · Kasem Khalil, Omar Eldash, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 18
YOLOv8 for defect inspection of hexagonal directed self-assembly patterns: a data-centric approach
2023 · Enrique Dehaerne, Bappaditya Dey, et al. · European Mask and Lithography Conference (EMLC) · 16
PDF
Machine Learning-Based Edge Placement Error Analysis and Optimization: A Systematic Review
2022 · Anh Tuan Ngo, Bappaditya Dey, et al. · IEEE Transactions on Semiconductor Manufacturing · 16
SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation
2023 · Vic De Ridder, Bappaditya Dey, et al. · International Symposium ELMAR (ELMAR) · 14
PDF
Towards improving challenging stochastic defect detection in SEM images based on improved YOLOv5
2022 · Bappaditya Dey, Enrique Dehaerne, et al. · SPIE Photomask Technology Conference · 14
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection
2022 · Enrique Dehaerne, Bappaditya Dey, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 14
PDF
SEMI-PointRend: improved semiconductor wafer defect classification and segmentation as rendering
2023 · MinJin Hwang, Bappaditya Dey, et al. · Metrology, Inspection, and Process Control XXXVI · 13
PDF
Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images
2024 · Bappaditya Dey, Vic De Ridder, et al. · International Symposium ELMAR (ELMAR) · 12
PDF
Unsupervised machine learning based SEM image denoising for robust contour detection
2021 · Bappaditya Dey, Stewart Wu, et al. · International Conference on Extreme Ultraviolet Lithography · 12
A Reversible-Logic based Architecture for Artificial Neural Network
2020 · Bappaditya Dey, Kasem Khalil, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 11
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review
2023 · Lechien, Thibault, Dehaerne, Enrique, et al. · arXiv (Cornell University) · 9
PDF
Architecture of A Novel Low-Cost Hardware Neural Network
2020 · Kasem Khalil, Omar Eldash, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 9
S²RNN: Self-Supervised Reconfigurable Neural Network Hardware Accelerator for Machine Learning Applications
2024 · Kasem Khalil, Bappaditya Dey, et al. · IEEE Internet of Things Journal · 7
PDF
Adaptive Hardware Architecture for Neural-Network-on-Chip
2022 · Kasem Khalil, Bappaditya Dey, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 7
A Reversible-Logic based Architecture for VGGNet
2021 · Bappaditya Dey, Kasem Khalil, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 7
SEMI-CenterNet: a machine learning facilitated approach for semiconductor defect inspection
2023 · Vic De Ridder, Bappaditya Dey, et al. · European Mask and Lithography Conference (EMLC) · 6
PDF
Works count: 72
Citation count: 604
H-index: 14
I10-index: 19
Year
Topic
Type