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Arijit Sengupta
Observed names:
A. Sengupta,
Sengupta, Arijit
Institutions:
Vanderbilt University,
Deutsches Zentrum für Luft- und Raumfahrt e. V. (DLR)
Observed institutions:
Vanderbilt University,
Deutsches Zentrum für Luft- und Raumfahrt e. V. (DLR),
University at Albany, State University of New York
ORCID:
0000-0002-3851-3843
Observed ORCID:
0000-0002-3851-3843
OpenAlex ID:
A5039907462
LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices
2024
·
Arijit Sengupta
, Dennis R. Ball
, et al.
·
IEEE Transactions on Nuclear Science
·
40
Single-Event Burnout in Vertical β -Ga₂O₃ Diodes With Pt/PtO ₓ Schottky Contacts and High- k Field-Plate Dielectrics
2024
·
S. Islam
, A. S. Senarath
, et al.
·
IEEE Transactions on Nuclear Science
·
39
Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes
2023
·
Arijit Sengupta
, Dennis R. Ball
, et al.
·
IEEE Transactions on Nuclear Science
·
38
Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design
2024
·
A. S. Senarath
, S. Islam
, et al.
·
Applied Physics Letters
·
22
PDF
Physical Model for SiC Power Device Heavy-Ion Burnout Based on Pre-Strike Depletion Capacitance Energy Storage
2025
·
Steven L. Kosier
, Arijit Sengupta
, et al.
·
IEEE Transactions on Nuclear Science
·
15
Heavy Ion-Induced Single-Event Leakage Current and Burnout in Homojunction GaN p-i-n Diodes
2025
·
A. S. Senarath
, S. Islam
, et al.
·
IEEE Transactions on Nuclear Science
·
14
Single-Event Effects in Heavy-Ion Irradiated 3-kV SiC Charge-Balanced Power Devices
2024
·
Arijit Sengupta
, Dennis R. Ball
, et al.
·
IEEE Transactions on Nuclear Science
·
13
Effects of Epitaxial Layer Thickness on Heavy Ion-Induced Single-Event Burnout in Vertical β-Ga₂O₃ Schottky Barrier Diodes
2025
·
S. Islam
, A. S. Senarath
, et al.
·
IEEE Transactions on Nuclear Science
·
10
Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga 2 O 3 Diodes with Pt and PtO x Schottky Contacts and High Permittivity Dielectric Field Plate
2023
·
Sajal Islam
, Aditha S. Senarath
, et al.
·
Conference digest
·
9
Temperature Dependence of Heavy-Ion-Induced Leakage Current in SiC Power MOSFETs
2025
·
K. Niskanen
, C. Martinella
, et al.
·
IEEE Transactions on Nuclear Science
·
6
Effects of Incident Angle on Single-Event Leakage Current Degradation in Heavy-Ion Irradiated 1800- and 4500-V SiC Power MOSFETs
2025
·
A. Sengupta
, C. Martinella
, et al.
·
IEEE Transactions on Nuclear Science
·
5
Physical Models for Epitaxial Doping Dependence of SELC in SiC Power Devices
2025
·
A. Sengupta
, S. L. Kosier
, et al.
·
IEEE Transactions on Nuclear Science
·
4
Unifying Model for Estimating SELC/SEB in SiC Power Devices Using a Nonlinear Ion Track Resistance
2026
·
Dennis R. Ball
, Steven L. Kosier
, et al.
·
IEEE Transactions on Nuclear Science
·
3
Heavy Ion Induced Single Event Effects in 6.5 and 10 kV SiC Power MOSFETs and Correlation to the SELC and SEB Depletion Capacitance Energy Models
2026
·
Sajal Islam
, Arijit Sengupta
, et al.
·
IEEE Transactions on Nuclear Science
·
1
Ideal Specific On-Resistance Versus Single-Event Burnout and Leakage Voltage Thresholds in Vertical SiC Power Devices
2026
·
Steven L. Kosier
, Arijit Sengupta
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
1
Comparative Study of SiC MOSFET and JFET using an Active Gate Driver
2022
·
Arijit Sengupta
, Mohammed Agamy
·
Global Power, Energy and Communication Conference
·
1
Efficient single-event effects test procedure for silicon carbide power devices
2026
·
Arijit Sengupta
, Andrew L. Sternberg
, et al.
·
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
Single-Event Leakage Current and Single-Event Burnout in High-Voltage GaN and SiC PiN Diodes: A Comparative Analysis
2026
·
Grant Mayberry
, Xianduo Zhao
, et al.
Influence of Ion LET and Epitaxial Thickness on Single-Event Effects in Homojunction GaN Vertical Diodes
2026
·
A. S. Senarath
, S. Islam
, et al.
·
IEEE Transactions on Nuclear Science
Active Gate Driving of Cascoded SiC JFETs
2022
·
Arijit Sengupta
, Sima Azizi Aghdam
, et al.
Characterization of wide-bandgap SiC field effect transistors and their active gate driving circuit in high power applications
2021
·
Sengupta, Arijit
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Works count:
24
Citation count:
222
H-index:
9
I10-index:
8
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