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Muhammad Adil Ansari

Observed names: M. Adil Ansari, Muhammad Adil Ansari
ORCID: 0000-0002-4675-5535
Observed ORCID: 0000-0002-4675-5535
OpenAlex ID: A5040056049
Test Architecture for Systolic Array of Edge-Based AI Accelerator
2021 · Umair Saeed Solangi, Muhammad Ibtesam, et al. · IEEE Access · 21
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Nonlinear System Identification Using Neural Network
2012 · Muhammad Asif Arain, Helon Vicente Hultmann Ayala, et al. · Communications in computer and information science · 18
Highly Efficient Test Architecture for Low-Power AI Accelerators
2021 · Muhammad Ibtesam, Umair Saeed Solangi, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 12
Parallel test method for NoC-based SoCs
2009 · Muhammad Adil Ansari, Jeahoon Song, et al. · International SoC Design Conference · 12
Time-Multiplexed 1687-Network for Test Cost Reduction
2017 · Muhammad Adil Ansari, Jihun Jung, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 11
Hybrid Test Data Transportation Scheme for Advanced NoC-Based SoCs
2015 · M. Adil Ansari, Dooyoung Kim, et al. · JSTS Journal of Semiconductor Technology and Science · 7
On Diagnosing the Aging Level of Automotive Semiconductor Devices
2016 · Jihun Jung, Muhammad Adil Ansari, et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 6
SONAR Based Obstacle Detection and Avoidance Algorithm
2009 · Muhammad Adil Ansari, Fahim Aziz Umrani · International Conference on Signal Acquisition and Processing · 5
Time-multiplexed test access architecture for stacked integrated circuits
2016 · Muhammad Adil Ansari, Jihun Jung, et al. · IEICE Electronics Express · 4
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Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators
2021 · Muhammad Ibtesam, Umair Saeed Solangi, et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 3
Study on Early Capture Based VLSI Aging Monitoring Techniques
2019 · Inamullah Sario, Abdul Bari Channa, et al. · International Conference on Computing, Mathematics and Engineering Technologies (iCoMET) · 2
Low Power Scan Chain Reordering Method with Limited Routing Congestion for Code-based Test Data Compression
2016 · Dooyoung Kim, M. Adil Ansari, et al. · JSTS Journal of Semiconductor Technology and Science · 2
Efficient diagnosis technique for aging defects on automotive semiconductor chips
2015 · Jihun Jung, Muhammad Adil Ansari, et al. · IEEE European Test Symposium (ETS) · 2
AMBA AXI 기반의 효율적인 SoC 테스트 제어기 설계
2009 · 이준섭, 정혜란, et al. · 대한전자공학회 학술대회 · 2
Time Division Multiplexing based Test Access for Stacked ICs
2019 · Muhammad Adil Ansari, Umair Saeed Solnagi, et al. · JSTS Journal of Semiconductor Technology and Science · 1
Network Load Analysis During Test Mode for the Network-on-Chip Reused Test Access Mechanisms
2018 · Muhammad Adil Ansari · International Conference on Computing, Electronics & Communications Engineering (iCCECE) · 1
Enabling test/diagnosis of automotive semiconductor chips through FlexRay network
2017 · Muhammad Adil Ansari, Abdul Rahim Ansari, et al. · International Conference on Electrical and Computing Technologies and Applications (ICECTA) · 1
Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells
2016 · Jihun Jung, Muhammad Adil Ansari, et al. · JSTS Journal of Semiconductor Technology and Science · 1
Two Tone Analysis of Magnesium Oxide Based Magnetic Tunnel Junctions
2020 · Ahsin Murtaza Bughio, Ehsan Ali Buriro, et al. · Quaid-e-Awam University Research Journal of Engineering Science & Technology
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Erratum to “Time-Multiplexed-Network for Test Cost Reduction” [Aug 18 1681-1691]
2018 · Muhammad Adil Ansari, Jihun Jung, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function
2018 · Dooyoung Kim, M. Adil Ansari, et al. · JSTS Journal of Semiconductor Technology and Science
Test access mechanism for automotive chips through vehicular control networks
2016 · Jinuk Kim, Muhammad Adil Ansari, et al. · IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)
Time-Multiplexed Test Access Architecture
2016 · Muhammad Adil Ansari
Design and Implementation of Autonomous Sonar Based Vehicle Robot
2011 · Muhammad Adil Ansari, Fahim Aziz Umrani, et al. · DOAJ (DOAJ: Directory of Open Access Journals)
Design, Mathematical Modeling a Simulation of a Robot System with 3-DOF
2005 · Muhammad Asif Arain, Muhammad Adil Ansari, et al.
Works count: 25
Citation count: 111
H-index: 6
I10-index: 5
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