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Tejender Singh Rawat

Observed names: Tejender Rawat, Tejender S. Rawat
Institution: Foxconn (Taiwan)
ORCID: 0000-0001-7894-0463
Observed ORCID: 0000-0001-7894-0463
OpenAlex ID: A5040582519
A Process-Aware Memory Compact-Device Model Using Long-Short Term Memory
2020 · Albert S. Lin, Sparsh Pratik, et al. · IEEE Access · 28
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Neuroevolution-Based Efficient Field Effect Transistor Compact Device Models
2021 · Ya-Wen Ho, Tejender Singh Rawat, et al. · IEEE Access · 16
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RRAM Compact Modeling Using Physics and Machine Learning Hybridization
2022 · Albert S. Lin, Po-Ning Liu, et al. · IEEE Transactions on Electron Devices · 13
Mapping Oxidation and Wafer Cleaning to Device Characteristics Using Physics-Assisted Machine Learning
2022 · Sparsh Pratik, Po-Ning Liu, et al. · ACS Omega · 10
Transparent planar indium tin oxide for a thermo-photovoltaic selective emitter
2020 · Yu-Bin Chen, Parag Parashar, et al. · Optical Materials Express · 9
Intelligent Photolithography Corrections Using Dimensionality Reductions
2019 · Parag Parashar, Chandni Akbar, et al. · IEEE photonics journal · 9
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Optical Proximity Correction Using Machine Learning Assisted Human Decision
2022 · Albert Lin, Tejender Rawat, et al. · IEEE photonics journal · 8
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A Reinforcement-Learning Based Approach for Designing High-Voltage SiC MOSFET Guard Rings
2024 · Tejender Singh Rawat, Chia-Lung Hung, et al. · IEEE Open Journal of Power Electronics · 7
Effect of Gate Length Relative to Recess Coverage on the Performance of Enhancement‐Mode β‐Ga 2 O 3 MOSFETs
2026 · Ching‐Hsuan Lee, Sheng‐Ti Chung, et al. · Advanced Electronic Materials · 6
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Optimization of laser annealing parameters based on bayesian reinforcement learning
2024 · Chung-Yuan Chang, Yen-Wei Feng, et al. · Journal of Intelligent Manufacturing · 6
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Analytics-statistics mixed training and its fitness to semisupervised manufacturing
2019 · Parag Parashar, Chun Han Chen, et al. · PLoS ONE · 6
Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing
2022 · Tejender Singh Rawat, Chung Yuan Chang, et al. · ACS Omega · 5
AI-Driven Parameter Prediction for SiC Power MOSFETs Guard Ring Design
2025 · Tejender Singh Rawat, Chia-Lung Hung, et al. · IEEE Access · 3
AgRo-Bot: An Autonomous Robot
2017 · Shubham Khandelwal, Neha Kaushik, et al. · International Journal of Advanced Research in Computer Science · 3
State-of-the-Art Power Electronics in AI Data Centers
2026 · Surya Elangovan, Yi-Chia Chiu, et al. · IEEE Open Journal of Power Electronics · 2
Human machine competition in intelligent laser manufacturing in semiconductor processes
2022 · Chung-Yuan Chang, Cheng Ching Hsu, et al. · Optical Manufacturing and Testing · 2
Advanced machine learning framework for parameter prediction in high-power SiC trench MOSFETs
2026 · Tejender Singh Rawat, Chia-Lung Hung, et al. · Materials Science in Semiconductor Processing · 1
Electrical performance of n-β-Ga₂O₃/p-GaN heterojunction diodes
2026 · Ai Ho, Chien-Nan Hsiao, et al. · Materials Today Electronics · 1
Design and characterization of 2-GaN MIS-HEMT integrated cascode power module
2025 · Surya Elangovan, Stone Cheng, et al. · Microelectronic Engineering · 1
Models for Self-Balancing of Two Wheeled Vehicles: A Review
2017 · Rahul Kumar, Ayush Mathur, et al. · International Journal on Recent and Innovation Trends in Computing and Communication · 1
Advancement in agriculture robots: review paper
2017 · Neha Kaushik, Sagarsharma -, et al. · International Journal of Recent Scientific Research · 1
CPW Feed Patch Antenna for GPS Applications
2012 · Yashu Rajput, Tejender Singh Rawat, et al. · 1
Electrical Performance of 4H-SiC MOSFETs with Different Gate Oxide Processes
2026 · Wei Chen Yu, Chia Lung Hung, et al. · Materials science forum
Gate-Drive-Integrated GaN HEMT Cascode Power Module (IPM) for High-Frequency Applications
2026 · Surya Elangovan, Sujatha Balasubramanian, et al. · Lecture notes in networks and systems
Stability Analysis of Dynamic On-State Resistance in Multiple-GaN Cascode Configuration
2025 · Surya Elangovan, Stone Cheng, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Works count: 33
Citation count: 141
H-index: 7
I10-index: 4
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