Author

Д. А. Букреев

Observed names: Bukreev, Dmitriy, D A Bukreev, D. A. Bukreev, D.A. Bukreev, D. A. Bukreev, Dmitriy A. Bukreev, Dmitry A. Bukreev, Д А Букреев, Д.А. Букреев
Observed institution: Irkutsk State University
ORCID: 0000-0002-8486-1849
Observed ORCID: 0000-0002-8486-1849
OpenAlex ID: A5041181974
2013 · V. O. Vas’kovskii, P. A. Savin, et al. · Technical Physics · 28
2020 · Dmitriy A. Bukreev, Michael S. Derevyanko, et al. · Materials · 25
2016 · A.V. Semirov, M.S. Derevyanko, et al. · Journal of Magnetism and Magnetic Materials · 24
2021 · Stanislav O. Volchkov, Anna A. Pasynkova, et al. · Sensors · 23
2020 · D.A. Bukreev, M.S. Derevyanko, et al. · Journal of Magnetism and Magnetic Materials · 13
2013 · A. V. Semirov, M. S. Derevyanko, et al. · Technical Physics · 13
2023 · Dmitry A. Bukreev, Michael S. Derevyanko, et al. · Sensors · 10
2009 · A. V. Semirov, D. A. Bukreev, et al. · Technical Physics · 10
2017 · A. V. Semirov, A. A. Moiseev, et al. · The Physics of Metals and Metallography · 9
2010 · A. V. Semirov, A. A. Moiseev, et al. · Russian Journal of Nondestructive Testing · 9
2020 · M. S. Derevyanko, D. A. Bukreev, et al. · The Physics of Metals and Metallography · 8
2012 · A. V. Semirov, D. A. Bukreev, et al. · Journal of Nanoscience and Nanotechnology · 8
2007 · A. V. Semirov, A. A. Gavrilyuk, et al. · Russian Journal of Nondestructive Testing · 7
2014 · Alexey A. Moiseev, Anton V. Petrov, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 6
2014 · Alexander V. Semirov, Michael S. Derevyanko, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 5
2023 · D. A. Bukreev, M. S. Derevyanko, et al. · The Physics of Metals and Metallography · 4
2022 · D. A. Bukreev, M. S. Derevyanko, et al. · The Physics of Metals and Metallography · 4
2020 · A. A. Moiseev, D. A. Bukreev, et al. · The Physics of Metals and Metallography · 4
2010 · Alexander V. Semirov, Dmitriy A. Bukreev, et al. · International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices · 4
Works count: 51
Citation count: 298
H-index: 10
I10-index: 11
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