Author

Juned A. Siddiqui

Observed names: J A Siddiqui, J. A. Siddiqui, J.A. Siddiqui, Juned A Siddiqui, Juned Ahmed Siddiqui, Juned Siddiqui, Siddiqui Juned A
ORCID: 0000-0003-3513-5514
Observed ORCID: 0000-0003-3513-5514
OpenAlex ID: A5041261002
2014 · V Arora, J A Siddiqui, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 52
2015 · J. A. Siddiqui, V. Arora, et al. · Experimental Mechanics · 33
2020 · Shreya Asoba, Shreya Supekar, et al. · International Conference on Innovative Mechanisms for Industry Applications · 14
2020 · Shivam Pareek, Shreya Shrivastava, et al. · International Conference on Trends in Electronics and Informatics (ICOEI) · 11
2017 · Ravibabu Mulaveesala, Geetika Dua, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
2015 · J A Siddiqui, V Arora, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 10
2014 · Ravibabu Mulaveesala, Juned A. Siddiqui, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
2013 · Ravibabu Mulaveesala, Subbarao V. Ghali, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2014 · Ravibabu Mulaveesala, Amarnath Muniyappa, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2015 · Ravibabu Mulaveesala, Juned Siddiqui, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2013 · Ravibabu Mulaveesala, Juned A. Siddiqui, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2013 · Ravibabu Mulaveesala, V. S. Ghali, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2014 · Ravibabu Mulaveesala, Vanita Arora, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2022 · Pratiksha Deodhar, Sanskar Jain, et al. · International Conference on Smart Generation Computing, Communication and Networking (SMART GENCON) · 4
2022 · Sanchita Dass, Juned A. Siddiqui, et al. · Russian Journal of Nondestructive Testing · 4
2023 · Govind Patidar, Animesh Kumbhakar, et al. · IEEE Conference on Information and Communication Technology (CICT) · 3
2021 · Parag Raverkar, Juned Ahmed Siddiqui, et al. · IEEE International Conference on Technology, Research, and Innovation for Betterment of Society (TRIBES) · 3
2023 · Sancita Dass, Juned A Siddiqui, et al. · Russian Journal of Nondestructive Testing · 2
2020 · J. A. Siddiqui, Sachin Patil · Lecture notes in civil engineering · 2
2025 · P Raverkar, J A Siddiqui, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 1
2024 · Shayantan Banerjee, Piyush Rathore, et al. · International Journal of Science and Research (IJSR) · 1
2015 · Ravibabu Mulaveesala, Vanita Arora, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Works count: 32
Citation count: 293
H-index: 10
I10-index: 10
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