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H.T. Kim

Observed names: Hyeonseong Kim, Kim, Hyeonseong
Institution: Kookmin University
ORCID: 0009-0007-9627-993X
Observed ORCID: 0009-0007-9627-993X
OpenAlex ID: A5041305440
Photonic high-frequency capacitance-voltage characterization of interface states in metal-oxide-semiconductor capacitors
2002 · D.M. Kim, H.C. Kim, et al. · IEEE Transactions on Electron Devices · 137
Sub-bandgap photonic gated-diode method for extracting distributions of interface states in MOSFETs
2003 · S.S. Chi, H.T. Kim, et al. · Electronics Letters · 3
Multi-Factor Authentication for In-Vehicle Secure OTA Protocol
2025 · Hyeonseong Kim, Sanghoon Jeon · IEEE Access · 2
AutoHack-Benchmark: A Physically Verified Multi-Bus CAN Dataset for Intrusion Detection System Evaluation
2026 · Song, Yuchan, Ahn, Sejun, et al. · Zenodo (CERN European Organization for Nuclear Research)
AutoHack: A Physically Verified Multi-Bus CAN Dataset for Intrusion Detection System Evaluation
2026 · Song, Yuchan, Ahn, Sejun, et al. · Zenodo (CERN European Organization for Nuclear Research)
Works count: 5
Citation count: 142
H-index: 2
I10-index: 1
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