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G. S. Cardoso
Observed name:
Guilherme S. Cardoso
Institution:
Instituto Federal Sul-rio-grandense
Observed institution:
Instituto Federal Sul-rio-grandense
ORCID:
0000-0003-2197-0906
Observed ORCID:
0000-0003-2197-0906
OpenAlex ID:
A5041633774
Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits
2024
·
Gustavo. P. Platcheck
, G. S. Cardoso
, et al.
·
IEEE Latin American Test Symposium (LATS)
·
8
Pseudo-Symmetric Enclosed Layout Transistors for Radiation Hardened Analog Applications
2022
·
Gustavo. P. Platcheck
, G. S. Cardoso
, et al.
·
IEEE Transactions on Aerospace and Electronic Systems
·
5
Variability and Analog Parameter Characterization in Enclosed Layout Transistors
2025
·
Gustavo P. Platcheck
, Guilherme S. Cardoso
, et al.
·
Journal of Electronic Testing
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Works count:
3
Citation count:
13
H-index:
2
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