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Author

Wataru Saito

Observed name: Wataru SAITO
Observed institution: Renesas Electronics (Japan)
ORCID: 0000-0003-2797-3307
Observed ORCID: 0000-0003-2797-3307
OpenAlex ID: A5041666130
A 30.2-µ Vrms Horizontal Streak Noise 8.3-Mpixel 60-Frames/s CMOS Image Sensor With Skew-Relaxation ADC and On-Chip Testable Ramp Generator for Surveillance Camera
2022 · Fukashi Morishita, Wataru Saito, et al. · IEEE Journal of Solid-State Circuits · 14
A Low Noise and Linearity Improvement CMOS Image Sensor for Surveillance Camera with Skew-Relaxation Local Multiply Circuit and On-Chip Testable Ramp Generator
2021 · Wataru Saito, Yoichi Iizuka, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 6
An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor
2020 · Fukashi Morishita, Masanori Otsuka, et al. · Proceedings - Asian Test Symposium/Proceedings · 6
A Low Noise 8.3-Mpixel CMOS Image Sensor With Selectable Multiple Sampling Technique by 5.36 GHz Global Counter and Dual Latch Skew Canceler
2025 · Yoichi Iizuka, Akihide Maezono, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 4
A Low Noise 8Mpixel CMOS Image Sensor with 5.36GHz Global Counter and Dual Latch Skew Canceler for Surveillance AI Camera System
2023 · Yoichi Iizuka, Akihide Maezono, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 1
A Compact Optical Image Stabilization Chip with Actuator Trackability Improvement Controller and Double Offset Cancel Hall Amplifier to Improve Camera Shake Correction.
2024 · Wataru Saito, Yoichi Lizuka, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC)
High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor
2022 · Fukashi MORISHITA, Wataru SAITO, et al. · IEICE Transactions on Electronics
Works count: 7
Citation count: 31
H-index: 4
I10-index: 1
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