Author

Satoshi Utsumi

Observed institution: Fukushima University
ORCID: 0000-0001-6482-1447
Observed ORCID: 0000-0001-6482-1447
OpenAlex ID: A5042001798
2026 · Shoma Tsuruta, Nanami Takahashi, et al. · ACM SIGCOMM Conference (SIGCOMM)
2026 · Satoshi Utsumi, Salahuddin Muhammad Salim Zabir, et al. · ACM SIGCOMM Conference (SIGCOMM)
2025 · Satoshi Utsumi, Junya Ishikawa, et al. · International Conference on Consumer Electronics
2020 · Satoshi Utsumi, Go Hasegawa · IEICE Technical Report; IEICE Tech. Rep.
2019 · Yuto Usuki, Asuka Ishii, et al. · IEICE Technical Report; IEICE Tech. Rep.
2011 · Ko Togashi, Satoshi Utsumi, et al. · Theory and Applications of Satisfiability Testing
Works count: 9
Citation count: 7
H-index: 2
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