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Torsten Richter
Observed names:
Richter, Torsten,
T. Richter
Institution:
Raith (Germany)
Observed institution:
Raith (Germany)
ORCID:
0009-0001-2512-1656
Observed ORCID:
0009-0001-2512-1656
OpenAlex ID:
A5042318246
Focused ion beams from GaBiLi liquid metal alloy ion sources for nanofabrication and ion imaging
2023
·
Achim Nadzeyka
, Torsten Richter
, et al.
·
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
·
10
Fabricating distributed feedback laser gratings with bismuth and gold focused ion beams
2024
·
B. Salmond
, D. D. John
, et al.
·
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
·
2
Automated High-Resolution SIMS Nanoanalytics for Advanced Semiconductor Failure Analysis
2026
·
Peter Gnauck
, Alexander Ost
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Automated Hyperspectral SIMS Nanoanalytics for Advanced Semiconductor Failure Analysis
2026
·
Peter Gnauck
, Alexander Ost
, et al.
·
Journal of Biosensors and Bioelectronics Research
High-Resolution Hyperspectral SIMS for Advanced Semiconductor and Materials Analysis
2026
·
Peter Gnauck
, Alexander Ost
, et al.
·
Microscopy and Microanalysis
An ion microscope for semiconductor process control and SIMS nanoanalytics
2026
·
Peter Gnauck
, Torsten Richter
, et al.
·
Metrology, Inspection, and Process Control XXXVI
An innovative SIMS platform with a multi-ion species FIB for high-resolution nanoanalytics, ion imaging and correlative microscopy
2025
·
Torsten Richter
, Alexander Ost
, et al.
PDF
The IONMASTER magSIMS: An Innovative Multi-ion Species FIB Platform for Correlative High-resolution Ion Microscopy and SIMS Analyses
2024
·
Alexander D Ost
, Torsten Richter
, et al.
·
Microscopy and Microanalysis
A new Ion Microscope for high-resolution imaging and SIMS nano-analytics
2024
·
Alexander Ost
, Torsten Richter
, et al.
·
BIO Web of Conferences
PDF
Room temperature stability of mass selected Ag clusters on C$_{60}$ functionalized surfaces
2008
·
Stefanie Duffe
, Lukas Patryarcha
, et al.
·
Bulletin of the American Physical Society
Properties of mass selected Ag clusters in comparison to Ag island growth studied by low-temperature STM and STS
2007
·
Stefanie Duffe
, T. Irawan
, et al.
·
Verhandlungen der Deutschen Physikalischen Gesellschaft
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Works count:
12
Citation count:
12
H-index:
2
I10-index:
1
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