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Suren Singh
Observed names:
S Singh,
Singh, Suren
Institutions:
Keysight Technologies (Singapore),
Keysight Technologies (United States),
Keysight Technologies (Austria),
Keysight Technologies (United Kingdom)
Observed institutions:
Agilent Technologies (United States),
Keysight Technologies (Singapore),
Keysight Technologies (United States),
Keysight Technologies (Austria),
Keysight Technologies (United Kingdom)
ORCID:
0000-0002-2409-8722
Observed ORCID:
0000-0002-2409-8722
OpenAlex ID:
A5042352419
A SU8 Micromachined WR-1.5 Band Waveguide Filter
2013
·
Xiaobang Shang
, Yingtao Tian
, et al.
·
IEEE Microwave and Wireless Components Letters
·
53
Cryogenic single-port calibration for superconducting microwave resonator measurements
2021
·
Haozhi Wang
, S Singh
, et al.
·
Quantum Science and Technology
·
38
PDF
Microwave calibration of qubit drive line components at millikelvin temperatures
2022
·
Slawomir Simbierowicz
, Volodymyr Y. Monarkha
, et al.
·
Applied Physics Letters
·
25
Subarray-SHORT De-Embedding for Improving Accuracy of On-Wafer Measurements of Devices for Millimeter and Submillimeter-Wave Applications
2021
·
Behnam Pouya
, Suren Singh
, et al.
·
IEEE Transactions on Microwave Theory and Techniques
·
5
SI Traceable RF and Microwave Power Measurements at Cryogenic Temperatures
2024
·
Murat Celep
, Sang-Hee Shin
, et al.
·
Conference on Precision Electromagnetic Measurements
·
4
Power Delay Profile Characterization for THz Communications Link
2025
·
Hirokazu Sawada
, Azril Haniz
, et al.
·
European Conference on Antennas and Propagation
·
3
Uncertainty of material measurements at microwave frequencies
2021
·
Andrea Ferrero
, Ruihua Wang
, et al.
·
IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)
·
3
From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing
2025
·
JP Teyssier
, Joel Dunsmore
, et al.
·
IEEE Microwave Magazine
·
2
First Calibration and Measurement Results of a Novel Wafer-Level Single-Sweep 100 kHz-250 GHz System
2026
·
Andrej Rumiantsev
, Hung Che Fu
, et al.
·
ARFTG Microwave Measurement Conference
·
1
Single Sweep Characterization of InP HEMT with a Novel 250 MHz - 250 GHz On-Wafer mTRL Design
2026
·
Huihua Cheng
, Andrej Rumiantsev
, et al.
·
European Microwave Conference (EuMC)
W-band Noise Figure using Novel VNA Extender and Novel Switched LNA
2025
·
Joel Dunsmore
, Suren Singh
, et al.
·
German Microwave Conference
Investigation of databased calibration for 1-Port cryogenic measurements
2021
·
Suren Singh
, Haozhi Wang
, et al.
·
Bulletin of the American Physical Society
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Works count:
15
Citation count:
134
H-index:
4
I10-index:
3
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