Author

J Zhang

Institution: University of Central Florida

Observed institution: University of Central Florida

OpenAlex ID: A5042425875

Design optimization of stacked layer dielectrics for minimum gate leakage currents

2000 · J Zhang, J.S Yuan, et al. · Solid-State Electronics · 27

Experimental evaluation of device degradation subject to oxide soft breakdown

2001 · J Zhang, J.S Yuan, et al. · Solid-State Electronics · 5

Works count: 2

Citation count: 32

H-index: 2

I10-index: 1