Author

Kosuke Hatsuda

Observed name: K. Hatsuda
OpenAlex ID: A5042713853
2010 · Hidehiro Shiga, Daisaburo Takashima, et al. · IEEE Journal of Solid-State Circuits · 77
2006 · Tomoaki Shino, Naoki Kusunoki, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 33
2007 · Takeshi Hamamoto, Yoshihiro Minami, et al. · IEEE Transactions on Electron Devices · 27
2022 · Soo Man Seo, Hisanori Aikawa, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 23
2005 · T. Ohsawa, K. Fujita, et al. · IEEE Journal of Solid-State Circuits · 21
2010 · Daisaburo Takashima, Yasushi Nagadomi, et al. · IEEE Journal of Solid-State Circuits · 19
2009 · H. Shiga, D. Takashima, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 19
2005 · T. Ohsawa, K. Fujita, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 19
2006 · T. Ohsawa, T. Higashi, et al. · Symposium on VLSI Circuits · 15
2011 · Takashi Ohsawa, Kosuke Hatsuda, et al. · IEEE Journal of Solid-State Circuits · 14
2025 · Kosuke Hatsuda, Katsuhiko Hoya, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 13
2007 · Fumiyoshi Matsuoka, Takashi Ohsawa, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 12
2006 · K. Hatsuda, K. Fujita, et al. · Custom Integrated Circuits Conference · 12
2006 · Y. Minami, T. Shino, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 7
2024 · Hisanori Aikawa, Jeonghwan Song, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 6
2019 · Katsuhiko Hoya, Kosuke Hatsuda, et al. · International Symposium on VLSI Design, Automation and Test · 5
2019 · Katsuhiko Hoya, Kosuke Hatsuda, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 3
2009 · Daisaburo Takashima, Yasushi Nagadomi, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 3
2006 · T. Hamamoto, Y. Minami, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 2
2025 · Kuniaki Sugiura, Hisanori Aikawa, et al. · IEEE Magnetic Recording Conference (TMRC)
2024 · Hiroomi Nakajima, Tomoaki Shino, et al. · Japanese Journal of Applied Physics
2024 · Hiroomi Nakajima, Tomoaki Shino, et al. · Japanese Journal of Applied Physics
2006 · Hiroomi Nakajima, Y. Minami, et al. · IEICE Technical Report; IEICE Tech. Rep.
2005 · Takashi Ohsawa, K. Fujita, et al. · 電子情報通信学会技術研究報告. ICD, 集積回路
Works count: 25
Citation count: 330
H-index: 12
I10-index: 13
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