Author

Douglas Burrows

2019 · Joel M. Fastenau, Dmitri Lubyshev, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 17
2009 · Jarrod Vaillancourt, Puminun Vasinajindakaw, et al. · Semiconductor Science and Technology · 12
2012 · Axel Reisinger, Richard Dennis, et al. · Infrared Physics & Technology · 11
2006 · Jason Bundas, Kelly Patnaude, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
2012 · Mani Sundaram, Axel Reisinger, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2008 · E. Plis, H. S. Kim, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2010 · Mani Sundaram, Axel Reisinger, et al. · Infrared Physics & Technology · 6
2010 · Jason Bundas, Richard Dennis, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2010 · Mani Sundaram, Axel Reisinger, et al. · Infrared Physics & Technology · 4
2006 · Mani Sundaram, Axel Reisinger, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2012 · Mani Sundaram, Axel Reisinger, et al. · Infrared Physics & Technology · 2
2011 · Mani Sundaram, Axel Reisinger, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2010 · Mani Sundaram, Axel Reisinger, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Works count: 15
Citation count: 198
H-index: 7
I10-index: 5
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