Author

Gertjan Kok

Observed names: G J P Kok, G Kok, G. J. Kok, G. J. P. KOK, G. J. P. Kok, G. Kok, G.J.P. Kok, Gertjan J.P Kok, Kok Gertjan, Kok, Gertjan
Observed institution: VSL National Metrology Institute
ORCID: 0000-0002-4441-856X
Observed ORCID: 0000-0002-4441-856X
OpenAlex ID: A5043133013
2012 · S. A. van den Berg, S. T. Persijn, et al. · Physical Review Letters · 164
2021 · Sascha Eichstädt, Maximilian Gruber, et al. · Sensors · 45
2018 · Tilman Sauerwald, Tobias Baur, et al. · Journal of sensors and sensor systems · 29
2024 · Giacomo Maculotti, Manuel Marschall, et al. · Metrology · 25
2025 · Peter Harris, Peter Friis Østergaard, et al. · Metrology · 22
2025 · Shahin Tabandeh, Anupam Prasad Vedurmudi, et al. · Measurement Sensors · 19
2021 · Helko E. van den Brom, Ronald van Leeuwen, et al. · IEEE Transactions on Electromagnetic Compatibility · 19
2017 · Laurent Spinelle, Michel Gerboles, et al. · EUROSENSORS Conference (EUROSENSORS) · 15
2015 · R H Bergmans, H J Nieuwenkamp, et al. · Measurement Science and Technology · 15
2019 · Ronald van Leeuwen, Helko van den Brom, et al. · IEEE International Workshop on Applied Measurements for Power Systems (AMPS) · 14
2024 · Manuel Marschall, Finn Hughes, et al. · Metrology · 12
2025 · Anupam Prasad Vedurmudi, Kruno Miličević, et al. · Measurement Sensors · 11
2022 · Gertjan Kok · tm - Technisches Messen · 11
2015 · G J P Kok, A M H van der Veen, et al. · Metrologia · 10
2025 · Finn Hughes, Manuel Marschall, et al. · Measurement Sensors · 9
2013 · Clemens Elster, Katy Klauenberg, et al. · International Congress of Metrology (CIM) · 9
2016 · G J P Kok, P M Harris, et al. · Metrologia · 8
2019 · Fani Barakou, Paul S. Wright, et al. · International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe) · 7
2025 · Gertjan Kok, Marcel van Dijk, et al. · Measurement Sensors · 6
Works count: 66
Citation count: 1,055
H-index: 13
I10-index: 19
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