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Aristeidis Nikolaou

Observed names: Nikolaou Aristeidis, Nikolaou, Aristeidis
ORCID: 0000-0002-0690-0830
Observed ORCID: 0000-0002-0690-0830
OpenAlex ID: A5043278366
Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout
2018 · Matthias Bucher, Aristeidis Nikolaou, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 29
Compact Modeling of Nonlinear Contact Effects in Short-Channel Coplanar and Staggered Organic Thin-Film Transistors
2021 · Jakob Pruefer, Jakob Leise, et al. · IEEE Transactions on Electron Devices · 27
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THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors
2023 · Alexander Kloes, Jakob Leise, et al. · IEEE Journal of the Electron Devices Society · 21
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Compact Modeling of Short-Channel Effects in Staggered Organic Thin-Film Transistors
2020 · Jakob Pruefer, Jakob Leise, et al. · IEEE Transactions on Electron Devices · 20
Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors Due to Carrier-Number and Correlated- Mobility Fluctuation
2020 · Aristeidis Nikolaou, Ghader Darbandy, et al. · IEEE Transactions on Electron Devices · 18
Compact model for the bias-depended low-frequency noise in organic thin-film transistors due to carrier-number and mobility-fluctuation effects
2023 · Aristeidis Nikolaou, Jakob Leise, et al. · Organic Electronics · 13
Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS
2018 · Loukas Chevas, Aristeidis Nikolaou, et al. · International Conference Mixed Design of Integrated Circuits and Systems · 12
Flexible megahertz organic transistors and the critical role of the device geometry on their dynamic performance
2021 · Jakob Leise, Jakob Pruefer, et al. · Journal of Applied Physics · 10
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Modeling of High Total Ionizing Dose (TID) Effects for Enclosed Layout Transistors in 65 nm Bulk CMOS
2018 · Aristeidis Nikolaou, Matthias Bucher, et al. · CAS proceedings · 10
Noise-Based Simulation Technique for Circuit-Variability Analysis
2020 · Aristeidis Nikolaou, Jakob Leise, et al. · IEEE Journal of the Electron Devices Society · 8
Extending a 65nm CMOS process design kit for high total ionizing dose effects
2018 · Aristeidis Nikolaou, Matthias Bucher, et al. · International Conference on Modern Circuits and Systems Technologies · 7
Variability of Low Frequency Noise and mismatch in enclosed-gate and standard nMOSFETs
2017 · Matthias Bucher, Aristeidis Nikolaou, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 7
Modeling the Short-Channel Effects in Coplanar Organic Thin-Film Transistors
2022 · Jakob Pruefer, Jakob Leise, et al. · IEEE Transactions on Electron Devices · 6
FOSS EKV2.6 Verilog-A Compact MOSFET Model
2019 · Wladek Grabinski, Marcelo Pavanello, et al. · European Solid-State Device Research Conference · 6
Macromodel for AC and Transient Simulations of Organic Thin-Film Transistor Circuits Including Nonquasistatic Effects
2020 · Jakob Leise, Jakob Pruefer, et al. · IEEE Transactions on Electron Devices · 5
Noise Based Variability Approach for DC Statistical Analysis of Organic TFT Based Circuits
2020 · Aristeidis Nikolaou, Jakob Leise, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 3
Design of Micropower Operational Transconductance Amplifiers for High Total Ionizing Dose Effects
2019 · Alexia Papadopoulou, Nikolaos Makris, et al. · International Conference on Modern Circuits and Systems Technologies · 3
Statistical analysis of 1/f noise in enclosed-gate N- and PMOS transistors
2017 · Aristeidis Nikolaou, Nikolaos Mavredakis, et al. · International Conference on Noise and Fluctuations · 2
Variability-Aware Circuit Design: Monte Carlo Simulation Versus Noise Analysis
2024 · Alexander Kloes, Nadine Dersch, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 1
Impact of Mechanical Bending on the Performance of Organic Thin-Film Transistors and the Characteristic Temperature of the Density of States
2022 · Aristeidis Nikolaou, Jakob Leise, et al. · International Conference Mixed Design of Integrated Circuits and Systems · 1
Fast Statistical Circuit Analysis Considering a Bias-Dependent Device Variability by Noise Simulation
2026 · Alexander Kloes, Ghader Darbandy, et al. · IEEE Journal of the Electron Devices Society
A Generic Approach for Compact Modeling of Variability and Low-Frequency Noise in Organic Thin-Film Transistors
2025 · Alexander Kloes, Ghader Darbandy, et al. · International Conference Mixed Design of Integrated Circuits and Systems
(Invited) Generic Compact Model for Variability and Low-Frequency Noise in Organic Thin-Film Transistors
2024 · Alexander Kloes, Ghader Darbandy, et al. · ECS Meeting Abstracts
Variability-Aware Characterization of Current Mirrors Based on Organic Thin-Film Transistors on Flexible Substrates
2021 · Aristeidis Nikolaou, Jakob Leise, et al. · International Conference Mixed Design of Integrated Circuits and Systems
(Invited) Compact Model for Short-Channel Organic Thin-Film Transistors with Extension for Non-Quasistatic Circuit Simulation and Variability Analysis
2021 · Alexander Kloes, Jakob Prüfer, et al. · ECS Meeting Abstracts
Works count: 34
Citation count: 210
H-index: 9
I10-index: 9
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