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Chia-Ming Jan

ORCID: 0000-0002-7690-5434
Observed ORCID: 0000-0002-7690-5434
OpenAlex ID: A5043403956
Integrating fault tolerance algorithm and circularly polarized ellipsometer for point-of-care applications
2011 · Chia-Ming Jan, Yu-Hsun Lee, et al. · Optics Express · 36
Optical interference system for simultaneously measuring refractive index and thickness of slim transparent plate
2021 · Chia-Ming Jan, Chien-Sheng Liu, et al. · Optics and Lasers in Engineering · 21
Implementation and Optimization of a Dual-confocal Autofocusing System
2020 · Chia-Ming Jan, Chien-Sheng Liu, et al. · Sensors · 7
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Intelligent Monitoring and Compensation between EDM and ECM
2023 · Min-Chun Chuang, Chia-Ming Jan, et al. · Applied Sciences · 6
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Development of low-cost heterodyne interferometer with virtual electronic phasemeter
2022 · Chia-Ming Jan, Chien-Sheng Liu, et al. · Measurement and Control · 3
Development of an On-Line Defect Detection System for EDM Process
2022 · Yu-Ting Lyu, Chia-Ming Jan, et al. · Applied Sciences · 3
Design and verification of the miniature optical system for small object surface profile fast scanning
2016 · Sheng Chi, Shu-Sheng Lee, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
An integrated platform for biomolecule interaction analysis
2013 · Chia-Ming Jan, Pei-I Tsai, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
High-precision Air-bearing Linear Motor Positioning Platform: Modeling, Sensing Integration, and Control Performance Evaluation
2026 · Ming-Chan Lee, Wen-Jie Hsu, et al. · Sensors and Materials
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Predictive Maintenance for Cutter System of Roller Laminator
2025 · Ssu-Han Chen, Chen-Wei Wang, et al. · Mathematics
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Design and Fabrication of Innovative Optical Head for Picosecond Laser Machining Applied on LED Sapphire Subtract Ablation
2018 · Chia-Ming Jan, Chou Chen-Bin · IEEE International Conference on Advanced Manufacturing (ICAM)
Development of the half-angle divergence metrology applied to the inner-layer exposure facility for PCB industry
2018 · Chia-Ming Jan, Cheng-Bang Huo · IEEE International Conference on Advanced Manufacturing (ICAM)
Development of the half-angle divergence metrology applied to the inner-layer exposure facility for PCB industry
2018 · Chia-Ming Jan, Cheng-Bang Huo · IEEE International Conference on Advanced Manufacturing (ICAM)
Development of Projection Fringes Phase Shifting Technology Based Optical System for Small Object Surface Profile Fast Scanning
2017 · Ti-Yu Lai, Shu-Sheng Lee, et al. · Springer eBooks
A portable intra-oral scanner based on sinusoidal pattern of fast phase-shifting
2016 · Chia-Ming Jan, Ying-Chieh Lin · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 15
Citation count: 78
H-index: 4
I10-index: 2
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