Author

J. R. A. Cleaver

Observed names: Cleaver, J.R.A., J R A Cleaver, J. R. A CLEAVER, J. R. A. CLEAVER, J. R. Cleaver, J.R.A. Cleaver, Jacob Cleaver

Institution: University of Michigan

Observed institutions: University of Cambridge, University of Michigan, Hitachi (Japan)

ORCID: 0000-0002-2851-4623

Observed ORCID: 0000-0002-2851-4623

OpenAlex ID: A5043465773

Diffusion controlled growth of metallic nanoclusters at selected surface sites

1996 · G. M. Francis, L. Kuipers, et al. · Journal of Applied Physics · 94

Electron beam induced deposition from W(CO)6 at 2 to 20 keV and its applications

1996 · P. C. Hoyle, J. R. A. Cleaver, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 94

Single-electron memory

1993 · K. Nakazato, R.J. Blaikie, et al. · Electronics Letters · 90

Characteristics of gas-assisted focused ion beam etching

1993 · R. J. Young, J. R. A. Cleaver, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 82

Gateable Suppression of Spin Relaxation in Semiconductors

2001 · J. S. Sandhu, A. P. Heberle, et al. · Physical Review Letters · 62

Electrically pumped single-photon sources in lateral p-i-n junctions

2004 · Xiulai Xu, D. A. Williams, et al. · Applied Physics Letters · 52

Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope

1982 · David J. Smith, R.A. Camps, et al. · Ultramicroscopy · 49

Direct observation of the structure of a metallic alloy glass

1979 · P.H. Gaskell, David J. Smith, et al. · Nature · 49

Ultralow-energy focused electron beam induced deposition

1994 · P. C. Hoyle, J. R. A. Cleaver, et al. · Applied Physics Letters · 45

Application of a focused ion beam system to defect repair of VLSI masks

1985 · P. J. Heard, J. R. A. Cleaver, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 45

Atomic resolution with a 600-kV electron microscope

1979 · V. E. Cosslett, R. A. Camps, et al. · Nature · 41

Electrical resistance of electron beam induced deposits from tungsten hexacarbonyl

1993 · P. C. Hoyle, M. Ogasawara, et al. · Applied Physics Letters · 38

Coulomb blockade in silicon based structures at temperatures up to 50 K

1993 · D. J. Paul, J. R. A. Cleaver, et al. · Applied Physics Letters · 34

A 100-kV ion probe microfabrication system with a tetrode gun

1981 · J. R. A. Cleaver, H. Ahmed · Journal of Vacuum Science and Technology · 34

Threshold reduction in pierced microdisk lasers

1999 · S. A. Backes, J. R. A. Cleaver, et al. · Applied Physics Letters · 32

Channelling ion image contrast and sputtering in gold specimens observed in a high-resolution scanning ion microscope

1988 · R. E. Franklin, E. C. G. Kirk, et al. · Journal of Materials Science Letters · 30

Focused ion beam repair techniques for clear and opaque defects in masks

1985 · J.R.A. Cleaver, H. Ahmed, et al. · Microelectronic Engineering · 30

Microdisk laser structures for mode control and directional emission

1998 · S. A. Backes, J. R. A. Cleaver, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 28

Femtosecond dynamics in semiconductor lasers: Dark pulse formation

1998 · M. Kauer, J. R. A. Cleaver, et al. · Applied Physics Letters · 28

Near-infrared to visible up-conversion in a forward-biased Schottky diode with a p-doped channel

2000 · J. S. Sandhu, A. P. Heberle, et al. · Applied Physics Letters · 27

Gas-assisted focused ion beam etching for microfabrication and inspection

1990 · R.J. Young, J.R.A. Cleaver, et al. · Microelectronic Engineering · 27

Transverse mode-locking in microcavity lasers

2002 · R. Gordon, A. P. Heberle, et al. · Applied Physics Letters · 26

Fabrication of submicrometer freestanding single-crystal gallium arsenide and silicon structures for quantum transport studies

1988 · D. G. Hasko, A. Potts, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 26

Electron heating effects in free-standing single-crystal GaAs fine wires

1990 · A Potts, M J Kelly, et al. · Journal of Physics Condensed Matter · 23