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Rajat Butola

Observed name: Rajat - Butola
ORCID: 0000-0001-7286-1246
Observed ORCID: 0000-0001-7286-1246
OpenAlex ID: A5043540905
A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs
2022 · Rajat Butola, Yiming Li, et al. · IEEE Access · 38
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A Comprehensive Technique Based on Machine Learning for Device and Circuit Modeling of Gate-All-Around Nanosheet Transistors
2023 · Rajat Butola, Yiming Li, et al. · IEEE Open Journal of Nanotechnology · 21
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Statistical Device Simulation and Machine Learning of Process Variation Effects of Vertically Stacked Gate-All-Around Si Nanosheet CFETs
2024 · Sekhar Reddy Kola, Yiming Li, et al. · IEEE Transactions on Nanotechnology · 17
Artificial Neural Network-Based Modeling for Estimating the Effects of Various Random Fluctuations on DC/Analog/RF Characteristics of GAA Si Nanosheet FETs
2022 · Rajat Butola, Yiming Li, et al. · IEEE Transactions on Microwave Theory and Techniques · 17
Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors
2022 · Rajat Butola, Yiming Li, et al. · Computers & Electrical Engineering · 11
Compact Model Build Upon Dynamic Weighting Artificial Neural Network Approach for Complementary Field Effect Transistors
2023 · Rajat Butola, Yiming Li, et al. · IEEE Transactions on Electron Devices · 9
Intelligent Photolithography Corrections Using Dimensionality Reductions
2019 · Parag Parashar, Chandni Akbar, et al. · IEEE photonics journal · 9
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Deep Learning Approach to Modeling and Exploring Random Sources of Gate-All-Around Silicon Nanosheet MOSFETs
2022 · Rajat Butola, Yiming Li, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 7
Estimating the Process Variation Effects of Stacked Gate All Around Si Nanosheet CFETs Using Artificial Neural Network Modeling Framework
2022 · Rajat Butola, Yiming Li, et al. · IEEE International Conference on Nanotechnology (IEEE-NANO) · 6
Deep Learning Approach to Estimating Work Function Fluctuation of Gate-All-Around Silicon Nanosheet MOSFETs with A Ferroelectric HZO Layer
2022 · Rajat Butola, Yiming Li, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 6
Analytics-statistics mixed training and its fitness to semisupervised manufacturing
2019 · Parag Parashar, Chun Han Chen, et al. · PLoS ONE · 6
Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps
2022 · Rajat Butola, Yiming Li, et al. · International Symposium on Quality Electronic Design (ISQED) · 5
Models for Self-Balancing of Two Wheeled Vehicles: A Review
2017 · Rahul Kumar, Ayush Mathur, et al. · International Journal on Recent and Innovation Trends in Computing and Communication · 1
ImmunoResponse Predictor: a GUI for accurate response prediction to immunotherapy
2026 · Rajat Butola, Shinsheng Yuan, et al. · PeerJ
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A DNN-Based Compact Modeling Technique for GAA Si NS FETs and Its Application in CMOS Circuit Simulation
2023 · Rajat - Butola, Sekhar Reddy Kola, et al. · International Conference on Solid State Devices and Materials (SSDM)
Raspit: wireless backup drive
2017 · Raj Deep Kumar, Shivam Rohilla, et al. · International Journal of Recent Scientific Research
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Facial emotion recognition techniques: a review
2017 · Piyush Saraswat, Manoj Kumar Pandey, et al. · International Journal of Recent Scientific Research
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Works count: 19
Citation count: 153
H-index: 7
I10-index: 5
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