Author

S. Bogdanovich

Observed name: Svetlana T. BOGDANOVICH

Observed institutions: General Electric (United States), Hologic (United States), GE Global Research (United States)

ORCID: 0009-0001-4313-3546

Observed ORCID: 0009-0001-4313-3546

OpenAlex ID: A5043903520

Temporal response of CZT detectors under intense irradiation

2003 · Yanfeng Du, J. LeBlanc, et al. · IEEE Transactions on Nuclear Science · 34

Image performance of a new amorphous selenium flat panel x-ray detector designed for digital breast tomosynthesis

2005 · L. K. Cheung, Z. Jing, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

Evolution of charge emission for amorphous silicon FETs exposed to radiation

2005 · S. Zelakiewicz, A. Couture, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 6

Measurement of the ionization response of amorphous selenium with 122 keV γ rays

2021 · X. Li, A.E. Chavarria, et al. · Journal of Instrumentation · 4

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Economic assessment of the cost of developing a voice assistant for oncology patients

2023 · Yuliya A. ZUENKOVA, Nikolai N. KOPYTOV, et al. · Economic Analysis Theory and Practice

Works count: 5

Citation count: 50

H-index: 4

I10-index: 1