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Author

G. Wang

Institution: Lehigh University
Observed institution: Lehigh University
OpenAlex ID: A5044289643
Local Melting during Electromigration in Cu Conductor Lines
2007 · H. Zhang, G. Wang, et al. · Journal of Electronic Materials · 5
Thermal and Electromigration-Induced Strains in Copper Conductor Lines: X-ray Microbeam Measurements and Analysis
2006 · G. Wang, H. Zhang, et al. · MRS Proceedings · 1
Works count: 2
Citation count: 6
H-index: 1
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