Author

Gino Giusi

Observed names: G. GIUSI, G. Giusi, Giusi, Gino

Observed institutions: University of Pisa, University of Messina, IMEC, National Research Council, Istituto Nazionale per la Fisica della Materia, Institute for Microelectronics and Microsystems, University of Calabria, KU Leuven

ORCID: 0000-0002-4231-1873

Observed ORCID: 0000-0002-4231-1873

OpenAlex ID: A5044411205

$1/f$ Noise in Drain and Gate Current of MOSFETs With High-$k$ Gate Stacks

2009 · P. Magnone, F. Crupi, et al. · IEEE Transactions on Device and Materials Reliability · 124

Ultraflexible Tactile Piezoelectric Sensor Based on Low-Temperature Polycrystalline Silicon Thin-Film Transistor Technology

2015 · Francesco Maita, Luca Maiolo, et al. · IEEE Sensors Journal · 76

Impact strain engineering on gate stack quality and reliability

2008 · C. Claeys, E. Simoen, et al. · Solid-State Electronics · 74

Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics

2006 · Gino Giusi, F. Crupi, et al. · IEEE Transactions on Electron Devices · 62

Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

2011 · Paolo Magnone, Felice Crupi, et al. · IEEE Transactions on Electron Devices · 59

Low-Power Artificial Neural Network Perceptron Based on Monolayer MoS2

2022 · Guilherme Migliato Marega, Zhenyu Wang, et al. · ACS Nano · 43

Bipolar Mode Operation and Scalability of Double-Gate Capacitorless 1T-DRAM Cells

2010 · Gino Giusi, Muhammad Ashraful Alam, et al. · IEEE Transactions on Electron Devices · 41

Junction Engineering of 1T-DRAMs

2013 · Gino Giusi, Giuseppe Iannaccone · IEEE Electron Device Letters · 39

Dedicated Instrumentation for High Sensitivity, Low Frequency Noise Measurement Systems

2004 · C. CIOFI, G. GIUSI, et al. · Fluctuation and Noise Letters · 36

Amperometric Biosensor and Front-End Electronics for Remote Glucose Monitoring by Crosslinked PEDOT-Glucose Oxidase

2018 · Yana Aleeva, Giovanni Maira, et al. · IEEE Sensors Journal · 35

PDF

Ultra‐low‐noise large‐bandwidth transimpedance amplifier

2014 · Gino Giusi, Gianluca Cannatà, et al. · International Journal of Circuit Theory and Applications · 30

Programmable, very low noise current source

2014 · G. Scandurra, G. Cannatà, et al. · Review of Scientific Instruments · 29

Analytical model for the 1∕f noise in the tunneling current through metal-oxide-semiconductor structures

2009 · F. Crupi, G. Giusi, et al. · Journal of Applied Physics · 28

Low-frequency (1/f) noise behavior of locally stressed HfO/sub 2//TiN gate-stack pMOSFETs

2006 · G. Giusi, E. Simoen, et al. · IEEE Electron Device Letters · 28

Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level

2015 · G. Giusi, O. Giordano, et al. · IEEE International Instrumentation and Measurement Technology Conference · 23

Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs

2009 · Debabrata Maji, Felice Crupi, et al. · IEEE Transactions on Electron Devices · 22

Evidence of Correlated Mobility Fluctuations in p-Type Organic Thin-Film Transistors

2015 · Gino Giusi, Orazio Giordano, et al. · IEEE Electron Device Letters · 21

Variability of the Drain Current in Junctionless Nanotransistors Induced by Random Dopant Fluctuation

2014 · Gino Giusi, Andrea Lucibello · IEEE Transactions on Electron Devices · 20

Performance and Reliability of Strained-Silicon nMOSFETs With SiN Cap Layer

2007 · Gino Giusi, Felice Crupi, et al. · IEEE Transactions on Electron Devices · 20

Enhanced Sensitivity Cross-Correlation Method for Voltage Noise Measurements

2006 · F. Crupi, G. Giusi, et al. · IEEE Transactions on Instrumentation and Measurement · 20

ESTIMATION ERRORS IN 1/fγ NOISE SPECTRA WHEN EMPLOYING DFT SPECTRUM ANALYZERS

2013 · G. GIUSI, G. SCANDURRA, et al. · Fluctuation and Noise Letters · 19

Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs

2009 · S. Chabukswar, D. Maji, et al. · Microelectronic Engineering · 19

Full Model and Characterization of Noise in Operational Amplifier

2009 · Gino Giusi, Felice Crupi, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 19

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio3 MIM Capacitors

2014 · Gino Giusi, Marc Aoulaiche, et al. · IEEE Electron Device Letters · 18

Physical insights of body effect and charge degradation in floating-body DRAMs

2014 · Gino Giusi · Solid-State Electronics · 18

Works count: 109

Citation count: 1,347

H-index: 20

I10-index: 43