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Lokesh Devaraj

Observed name: Devaraj, Lokesh
ORCID: 0000-0002-2421-8368
Observed ORCID: 0000-0002-2421-8368
OpenAlex ID: A5044690640
Electromagnetic Risk Analysis for EMI Impact on Functional Safety With Probabilistic Graphical Models and Fuzzy Logic
2020 · Lokesh Devaraj, Alastair R. Ruddle, et al. · IEEE Letters on Electromagnetic Compatibility Practice and Applications · 29
Application of Probabilistic Models for Multitone Electromagnetic Immunity Analysis
2022 · Lokesh Devaraj, Qazi Mashaal Khan, et al. · IEEE Transactions on Electromagnetic Compatibility · 11
System Level Risk Analysis for Immunity in Automotive Functional Safety Analyses
2020 · Lokesh Devaraj, Alastair R. Ruddle, et al. · International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe) · 11
Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress
2022 · Qazi Mashaal Khan, Lokesh Devaraj, et al. · IEEE Access · 9
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Synergistic Effect of Multitone EMI on the Conducted Immunity of Integrated Oscillators
2022 · Qazi Mashaal Khan, Lokesh Devaraj, et al. · IEEE Letters on Electromagnetic Compatibility Practice and Applications · 8
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Lithographic effects due to particles on high-NA EUV mask pellicle
2019 · Lokesh Devaraj, Gerardo Bottiglieri, et al. · European Mask and Lithography Conference (EMLC) · 8
Risk Assessment Approach for EM Resilience in Complex Systems Using Bayesian Networks
2021 · Lokesh Devaraj, Alastair R. Ruddle, et al. · IEEE International Symposium on Electromagnetic Compatibility · 7
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Comparing Simulated Impact of Single Frequency and Multitone EMI for an Integrated Circuit
2022 · Lokesh Devaraj, Qazi Mashaal Khan, et al. · International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) · 4
EMI Risk Estimation for System-Level Functions Using Probabilistic Graphical Models
2021 · Lokesh Devaraj, Alastair R. Ruddle, et al. · IEEE International Symposium on Electromagnetic Compatibility · 3
Particle on EUV pellicles, impact on LWR
2019 · Michiel Kupers, Gijsbert Rispens, et al. · International Conference on Extreme Ultraviolet Lithography · 3
Improvements proposed to noisy-OR derivatives for multi-causal analysis: A case study of simultaneous electromagnetic disturbances
2023 · Lokesh Devaraj, Qazi Mashaal Khan, et al. · International Journal of Approximate Reasoning · 1
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Knowledge-Based Approach for System Level Electromagnetic Safety Analysis
2021 · Lokesh Devaraj, Alastair R. Ruddle, et al. · European Safety and Reliability Conference (ESREL)
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Works count: 14
Citation count: 95
H-index: 7
I10-index: 3
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