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W. Terghini
Observed name:
TERGHINI, W.
Institution:
University of Biskra
Observed institution:
University of Biskra
OpenAlex ID:
A5045078596
Measurement and Analysis of I-v-t Characteristics of a Augeni/p-si Schottky Barrier Diode
2015
·
TERGHINI, W.
, SAADOUNE, A.
, et al.
·
Courrier du Savoir (Universite de Biskra)
·
1
Electrical Characterization of the Forward Current- Voltage of Al Implanted 4h-sic Pin Diodes
2016
·
M. L. Megherbi
, L. Dehimi
, et al.
Extraction of important parameters of a silicon diode used as particles detector
2012
·
Achour Saadoune
, L. Dehimi
, et al.
·
Journal of New Technology and Materials
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Works count:
3
Citation count:
1
H-index:
1
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