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Massimiliano Olmo
Observed names:
M Olmo,
M. Olmo
Institution:
SunEdison (Italy)
Observed institutions:
SunEdison (United States),
SunEdison (Italy)
OpenAlex ID:
A5045149385
The effect of oxide precipitates on minority carrier lifetime in p-type silicon
2011
·
J. D. Murphy
, K. Bothe
, et al.
·
Journal of Applied Physics
·
89
The effect of oxide precipitates on minority carrier lifetime in n -type silicon
2015
·
J. D. Murphy
, M. Al-Amin
, et al.
·
Journal of Applied Physics
·
79
PDF
Oxygen precipitation in silicon: Experimental studies and theoretical investigations within the classical theory of nucleation
1999
·
K. F. Kelton
, R. Falster
, et al.
·
Journal of Applied Physics
·
77
Effect of High Temperature Pre-Anneal on Oxygen Precipitates Nucleation Kinetics in Si
1997
·
Robert J. Falster
, M. Cornara
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
56
Vacancy-Assisted Oxygen Precipitation Phenomena in Si
1997
·
Robert J. Falster
, M. Pagani
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
55
Spatial variations in oxygen precipitation in silicon after high temperature rapid thermal annealing
1997
·
M. Pagani
, R. J. Falster
, et al.
·
Applied Physics Letters
·
50
The Engineering of Silicon Wafer Material Properties Through Vacancy Concentration Profile Control and the Achievement of Ideal Oxygen Precipitation Behavior
1998
·
R. Falster
, D. Gambaro
, et al.
·
MRS Proceedings
·
46
Observation of Vacancy Enhancement during Rapid Thermal Annealing in Nitrogen
1997
·
M. Jacob
, P. Pichler
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
19
Minority Carrier Lifetime in Czochralski Silicon Containing Oxide Precipitates
2010
·
John D. Murphy
, Karsten Bothe
, et al.
·
ECS Transactions
·
8
PDF
Influence of different growth and nucleation times on optical spectra of precipitated oxygen in silicon
2000
·
A Borghesi
, A Sassella
, et al.
·
Materials Science and Engineering B
·
7
An Investigation of the Limit of Detection and the Scattering Dependence of the Optical Precipitate Profiler (OPP)
1998
·
L. Mule'stagno
, D.E. Hill
, et al.
·
MRS Proceedings
·
4
Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon
2001
·
A. Bazzali
, G. Borionetti
, et al.
·
Materials Science in Semiconductor Processing
·
3
Recombination at Oxide Precipitates in Silicon
2011
·
John D. Murphy
, Karsten Bothe
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
2
Absorption coefficient of oxide precipitates in silicon wafers after different three-step annealing
2003
·
A. Sassella
, A. Borghesi
, et al.
·
Materials Science and Engineering B
·
1
Impact of Oxide Precipitates on Minority Carrier Lifetime in Silicon
2012
·
John D. Murphy
, Karsten Bothe
, et al.
·
ECS Meeting Abstracts
PDF
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Works count:
15
Citation count:
496
H-index:
8
I10-index:
8
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