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Rudrajit Dutta
Institutions:
Intel (Ireland),
Intel (United States)
Observed institutions:
Intel (Ireland),
Intel (United States)
OpenAlex ID:
A5046035570
Defect-Oriented Test: Effectiveness in High Volume Manufacturing
2020
·
Friedrich Hapke
, Will Howell
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
33
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Works count:
1
Citation count:
33
H-index:
1
I10-index:
1
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