Author

Eugene L. Church

Observed names: Church, E. L., Church, E.L. (Army Armament Research and Development Command, Dover, NJ (United States)), Church, Eugene, Church,Eugene L., E Church, E L Church, E L. Church, E. Church, E. L. Church, E.L. Church, Eugene Church

Observed institutions: Argonne National Laboratory, United States Department of the Army, University of Arizona, Brookhaven National Laboratory, United States Army, Advanced Optical Systems (United States), U.S. Army Combat Capabilities Development Command Armaments Center, U.S. Army Engineer Research and Development Center, Stanford University

OpenAlex ID: A5046248503

Fractal surface finish

1988 · Eugene L. Church · Applied Optics · 252

Electric-Monopole Transitions in Atomic Nuclei

1956 · E. L. Church, J. Weneser · Physical Review · 235

Nuclear Structure Effects in Internal Conversion

1960 · E L Church, J Weneser · Annual Review of Nuclear Science · 175

Residual surface roughness of diamond-turned optics

1975 · E. L. Church, J. M. Zavada · Applied Optics · 129

Effect of the Finite Nuclear Size on Internal Conversion

1956 · E. L. Church, J. Weneser · Physical Review · 129

Measurement of the Finish of Diamond-Turned Metal Surfaces By Differential Light Scattering

1977 · E. L. Church, H. A. Jenkinson, et al. · Optical Engineering · 128

The Determination of Gamma-Ray Energies from Beta-Ray Spectroscopy and a Table of Critical X-Ray Absorption Energies

1952 · R. D. Hill, E. L. Church, et al. · Review of Scientific Instruments · 123

Specification of surface figure and finish in terms of system performance

1993 · E. L. Church, P. Z. Takacs · Applied Optics · 85

Optimal estimation of finish parameters

1991 · Eugene L. Church, Peter Z. Takacs · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 74

Improvements in the accuracy and the repeatability of long trace profiler measurements

1999 · Peter Z. Takacs, Eugene L. Church, et al. · Applied Optics · 69

Long Trace Profile Measurements On Cylindrical Aspheres

1989 · Peter Z. Takacs, Su-chen K. Feng, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 69

The measurement of surface texture and topography by differential light scattering

1979 · E.L. Church · Wear · 69

Specification of glancing- and normal-incidence x-ray mirrors [also Erratum 34(11)3348(Nov1995)]

1995 · Eugene L. Church, Peter Z. Takacs · Optical Engineering · 54

Electric-Monopole Directional-Correlation Experiments

1958 · E. L. Church, M. E. Rose, et al. · Physical Review · 54

Direct Comparison Of Mechanical And Optical Measurements Of The Finish Of Precision Machined Optical Surfaces

1985 · E. L. Church, T. V. Vorburger, et al. · Optical Engineering · 43

The Geometrical Correction in Angular Correlation Measurements

1952 · E. L. Church, J. J. Kraushaar · Physical Review · 41

Electric-Monopole Transitions in Atomic Nuclei

1955 · E. L. Church, J. Weneser · Physical Review · 34

Low Energy γ -Transitions in Some Rare Earth Isotopes

1952 · J. W. Mihelich, E. L. Church · Physical Review · 34

Sign of the Interference Particle Parameter in Conversion-Electron Directional Correlation

1964 · E. L. Church, A. Schwarzschild, et al. · Physical Review · 33

Effects of the nonvanishing tip size in mechanical profile measurements

1991 · Eugene L. Church, Peter Z. Takacs · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 31

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Modeling chaotic systems with hidden Markov models

1992 · C. Myers, A. Singer, et al. · IEEE International Conference on Acoustics Speech and Signal Processing · 30

Use of an optical profiling instrument for the measurement of the figure and finish of optical quality surfaces

1986 · E.L. Church, P.Z. Takacs · Wear · 28

Internal Conversion in the L and M Subshells

1955 · E. L. Church, J. E. Monahan · Physical Review · 28

The Interpretation Of Glancing Incidence Scattering Measurements

1986 · E. L. Church, P. Z. Takacs · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 27

Step-height standard for surface-profiler calibration

1993 · Peter Z. Takacs, Michelle X. Li, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 24

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Works count: 117

Citation count: 2,381

H-index: 24

I10-index: 41