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Ashish Maurya

Analog and RF performance optimization for gate all around tunnel FET using broken-gap material
2022 · Pankaj Kumar, Kalyan Koley, et al. · Scientific Reports · 25
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Investigation of Single-Event-Transient Effects Induced by Heavy-Ion in All-Silicon DG-TFET
2022 · Ashish Maurya, Kalyan Koley, et al. · IEEE Access · 23
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Assessment of Negative Bias Temperature Instability Due to Interface and Oxide Trapped Charges in Gate-All-Around TFET Devices
2023 · Pankaj Kumar, Kalyan Koley, et al. · IEEE Transactions on Nanotechnology · 15
Investigation of Source Region’s Random Doping Fluctuation Effects on Analog and RF Performance in All-Si DG-TFET
2022 · Ashish Maurya, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 15
Machine learning and explainable-AI based prediction of gate-all-around ferroelectric-FET: how ML models influence XAI
2025 · Shailendra Yadav, Nakul Giri, et al. · Physica Scripta · 11
Assessment of interface trapped charge induced threshold voltage hysteresis effect in gate-all-around TFET
2022 · Pankaj Kumar, Kalyan Koley, et al. · Micro and Nanostructures · 7
Investigation of Pocket Engineering in GNR Tunnel-FET Using Analog/RF Figures of Merit
2024 · Md Akram Ahmad, Ashish Maurya, et al. · IEEE Transactions on Electron Devices · 5
An efficient algebraic codebook structure for CS-ACELP based speech codecs
2017 · Bhawana Kumari, Ashish Maurya, et al. · International Conference on Computing, Communication and Networking Technologies (ICCCNT) · 5
Implementation and Performance Analysis of Low Power 1 GHz 4-Bit Flash ADC Using III–V Tunnel-FET
2022 · Ashish Maurya, Pankaj Rahi, et al. · Circuits Systems and Signal Processing · 4
Heavy ions and alpha particles irradiation impact on III-V broken-gap gate-all-around TFET
2024 · Pankaj Kumar, Kalyan Koley, et al. · Microelectronics Reliability · 3
Performance Analysis of Compound III-V Semiconductor Materials based MOSFET
2022 · Ashish Maurya, Md Akram Ahmad, et al. · IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON) · 3
Surface Orientated < 100 > , < 110 > , and < 111 > Silicon-based Double-Gate Tunnel-FET for Linearity and Analog/RF Performance Analysis
2022 · Ashish Maurya, Kalyan Koley, et al. · Silicon · 2
Electrical Noise Behaviour of High-k Gate-All-Around MOSFET Based on Two-Port Device Network Analysis
2022 · Pankaj Kumar, Kalyan Koley, et al. · 2
Calculation of OFF-Current of Tunnel FETs based on Subthreshold Swing: A New Approach
2020 · Ashish Maurya, Kalyan Koley, et al. · IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) · 1
Intelligent Poultry Farm Management Through Real-Time Monitoring Using IoT and Edge-Based Computer Vision
2026 · Vivek Yadav, Adrija Bose, et al. · International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S)
Effect of Random Dopant Fluctuation (RDF) on Performance of Homo- and Hetero-Tunnel FETs
2026 · Ashish Maurya, Abhay Pratap, et al. · IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI)
Heavy-Ion Impact Analysis of Nanoscale Double-Gate Tunnel-FET
2026 · Ashish Maurya, Sagar, et al. · Lecture notes in electrical engineering
Assessment of Temperature Variation on Electrostatic Behaviour of Extended Source Tunnel Field Effect Transistor for Enhanced Performance
2026 · Vedvrat, Rahul Kumar Singh, et al. · Lecture notes in electrical engineering
Design and Analysis of Heterojunction TFET based Dielectric Modulated Biosensor
2025 · Kavindra Kumar Kavi, Satish Chandra, et al. · International Conference on Electrical, Electronics, Communication and Computers (ELEXCOM)
Performance Enhancement of Junctionless-Nanowire FeFET Through Gate-Control Design
2025 · Mandeep Singh, Manas Baiswar, et al. · International Conference on Internet of Everything, Microwave Engineering, Communication and Networks (IEMECON)
Variability in tunnel field-effect transistor
2025 · Ashish Maurya · CRC Press eBooks
Assessment of hot carrier stress induced threshold voltage shift in gate-all-around MOSFETs
2022 · Pankaj Kumar, Kalyan Koley, et al. · IEEE India Conference
Works count: 22
Citation count: 121
H-index: 6
I10-index: 5
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