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Author

Rosa Rodriguez-Montanes

Observed names: R Rodrı́guez-Montañés, R. Rodriguez-Montanes, R. Rodríguez-Montañés, R. Rodríguez-Montañés, R. RodríGuez-Montañés, R. Rodríguez-Montañés, R. Rodríguez‐Montañés, R.R. Montanes, Rodriguez-Montanes, R, Rodríguez Montañés, Rosa, Rodríguez-Montañés, Rosa, Rosa Rodriguez-Montañés, Rosa Rodríguez Montañés, Rosa Rodríguez-Montañés
ORCID: 0000-0001-6231-0862
Observed ORCID: 0000-0001-6231-0862
OpenAlex ID: A5047134367
Bridging defects resistance measurements in a CMOS process
1992 · R. Rodriguez-Montanes, E.M.J.G. Bruis, et al. · IEEE International Test Conference (ITC) · 176
Resistance characterization for weak open defects
2002 · R.R. Montanes, J.P. de Gyvez, et al. · IEEE Design & Test of Computers · 172
Current Vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in Cmos
2005 · R. Rodriguez-Montanes, J.A. Segura, et al. · IEEE International Test Conference (ITC) · 102
Experimental Characterization of CMOS Interconnect Open Defects
2007 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 57
The Low Area Probing Detector as a Countermeasure Against Invasive Attacks
2017 · Michael Weiner, Salvador Manich, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 46
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Defective Behaviours of Resistive Opens in Interconnect Lines
2005 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE European Test Symposium (ETS) · 42
Unpredictable Bits Generation Based on RRAM Parallel Configuration
2018 · Daniel Arumi, Alvaro Gomez-Pau, et al. · IEEE Electron Device Letters · 31
Analysis of bridging defects in sequential CMOS circuits and their current testability
2002 · R. Rodriguez-Montanes, J. Figueras · European Design and Test Conference · 28
Diagnosis of Full Open Defects in Interconnecting Lines
2007 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE VLSI Test Symposium (VTS) · 26
Current vs. logic testability of bridges in scan chains
2002 · R. Rodriguez-Montanes, J. Figueras, et al. · 22
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs
2023 · Maryam Akbari, Sattar Mirzakuchaki, et al. · IEEE Access · 20
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IDDQ testing: state of the art and future trends
1998 · A Ferré, E Isern, et al. · Integration · 19
RRAM Random Number Generator Based on Train of Pulses
2021 · Binbin Yang, Daniel Arumí, et al. · Electronics · 16
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Post-bond test of Through-Silicon Vias with open defects
2014 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE European Test Symposium (ETS) · 16
Quiescent Current Analysis and Experimentation of Defective CMOS Circuits
1992 · J. A. Segura, V. H. Champac, et al. · Springer eBooks · 16
Postbond Test of Through-Silicon Vias With Resistive Open Defects
2019 · Rosa Rodriguez-Montanes, Daniel Arumi, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 15
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Prebond Testing of Weak Defects in TSVs
2015 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 15
Full Open Defects in Nanometric CMOS
2008 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE VLSI Test Symposium (VTS) · 15
Impact of gate tunnelling leakage on CMOS circuits with full open defects
2007 · R. Rodríguez-Montañés, D. Arumí, et al. · Electronics Letters · 12
RRAM based random bit generation for hardware security applications
2016 · Daniel Arumi, Salvador Manich, et al. · Conference on Design of Circuits and Integrated Systems · 11
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Power-aware voltage tuning for STT-MRAM reliability
2015 · Elena I. Vatajelu, R. Rodriguez-Montanes, et al. · IEEE European Test Symposium (ETS) · 11
Localization and Electrical Characterization of Interconnect Open Defects
2010 · Rosa Rodriguez-Montanes, Daniel Arumi, et al. · IEEE Transactions on Semiconductor Manufacturing · 11
True Random Number Generator Based on RRAM-Bias Current Starved Ring Oscillator
2023 · D. Arumí, S. Manich, et al. · IEEE Journal on Exploratory Solid-State Computational Devices and Circuits · 10
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Delay caused by resistive opens in interconnecting lines
2008 · D. Arumí, R. Rodríguez-Montañés, et al. · Integration · 10
Electrical and topological characterization of interconnect open defects
2005 · R. Rodriguez-Montanes, J. Figueras · IEEE International Workshop on Current and Defect Based Testing (DBT) · 10
Works count: 84
Citation count: 1,090
H-index: 15
I10-index: 25
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