Author

James M. Sylvia

Observed name: J Sylvia
Institution: EIC Laboratories
Observed institution: EIC Laboratories
OpenAlex ID: A5048098065
2000 · James M. Sylvia, James A. Janni, et al. · Analytical Chemistry · 616
2002 · Andrew A. Guzelian, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 41
2013 · Fei Wang, James M. Sylvia, et al. · Journal of Power Sources · 33
2015 · Susan L. Clauson, James M. Sylvia, et al. · Applied Spectroscopy · 31
2004 · Kevin M. Spencer, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 19
1999 · Kevin M. Spencer, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2004 · Kevin M. Spencer, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2002 · Kevin M. Spencer, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2008 · Jane F. Bertone, Kevin M. Spencer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
1998 · John W. Haas III, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2004 · Jane F. Bertone, Kellie L. Cordeiro, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2010 · Kevin M. Spencer, Susan L. Clauson, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2002 · James A. Janni, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2010 · Kevin M. Spencer, James M. Sylvia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2011 · Kevin M. Spencer, Susan L. Clauson, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
1998 · J Sylvia, J Haas, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 1
Works count: 16
Citation count: 794
H-index: 8
I10-index: 6
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