Author

A. Kiss

Observed names: A Kiss, Adrien Kiss, Kiss, Adrien
ORCID: 0000-0001-7136-1880
Observed ORCID: 0000-0001-7136-1880
OpenAlex ID: A5048216386
2020 · H Fang, F Bielsa, et al. · Metrologia · 51
2011 · A. Picard, Michael P. Bradley, et al. · IEEE Transactions on Instrumentation and Measurement · 34
2020 · M Stock, P Conceição, et al. · Metrologia · 33
2014 · H Fang, A Kiss, et al. · Metrologia · 33
2008 · A. Picard, Hao Fang, et al. · IEEE Transactions on Instrumentation and Measurement · 27
2017 · Shisong Li, Franck Bielsa, et al. · Metrologia · 26
2012 · H. Fang, A. Kiss, et al. · IEEE Transactions on Instrumentation and Measurement · 26
2023 · M Stock, P Conceição, et al. · Metrologia · 21
2015 · F Bielsa, Y F Lu, et al. · Metrologia · 21
2011 · Estefania de Mirandés, Hao Fang, et al. · IEEE Transactions on Instrumentation and Measurement · 15
2019 · Shisong Li, Franck Bielsa, et al. · IEEE Transactions on Instrumentation and Measurement · 11
2018 · S. Li, M. Stock, et al. · 2018 International Applied Computational Electromagnetics Society Symposium (ACES) · 9
2016 · H. Fang, F. Bielsa, et al. · Conference on Precision Electromagnetic Measurements · 9
2021 · F. Bielsa, H. Fang, et al. · IEEE Transactions on Instrumentation and Measurement · 8
2012 · H. Fang, A. Kiss, et al. · Conference on Precision Electromagnetic Measurements · 8
2018 · H. Fang, F. Bielsa, et al. · Conference on Precision Electromagnetic Measurements · 7
2024 · F. Bielsa, K. Fujita, et al. · Conference on Precision Electromagnetic Measurements · 5
2024 · H. Fang, F. Bielsa, et al. · Conference on Precision Electromagnetic Measurements · 4
2020 · F. Bielsa, H. Fang, et al. · Conference on Precision Electromagnetic Measurements · 4
2018 · S. Li, M. Stock, et al. · Conference on Precision Electromagnetic Measurements · 4
2016 · F. Bielsa, L. Robertsson, et al. · Conference on Precision Electromagnetic Measurements · 4
2020 · H. Fang, F. Bielsa, et al. · Conference on Precision Electromagnetic Measurements · 3
2018 · F. Bielsa, B. Rolland, et al. · Conference on Precision Electromagnetic Measurements · 3
Works count: 36
Citation count: 422
H-index: 11
I10-index: 12
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