Author

T. Vu-Cong

Observed names: C-T. Vu, Cong Thanh Vu, Cong, Thanh Vu, T Vu-Cong, T. Vu Cong, Thanh Vu-Cong, Vu, C. T., Vu, Cong Thanh, Vu-Cong, T., Vu-Cong, Thanh
Institution: Supergrid Institute
ORCID: 0000-0001-8520-6048
Observed ORCID: 0000-0001-8520-6048
OpenAlex ID: A5048277875
2013 · T Vu-Cong, C Jean-Mistral, et al. · Smart Materials and Structures · 70
2012 · C. Jean-Mistral, T. Vu Cong, et al. · Applied Physics Letters · 68
2020 · C. Toigo, T. Vu-Cong, et al. · IEEE Transactions on Dielectrics and Electrical Insulation · 58
2013 · T. Vu-Cong, C. Jean-Mistral, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 37
2016 · Thanh Vu-Cong, Laetitia Zavattoni, et al. · IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) · 30
2022 · Thanh Vu-Cong, Caterina Toigo, et al. · IEEE Transactions on Dielectrics and Electrical Insulation · 24
2013 · C Jean-Mistral, T Vu-Cong, et al. · Smart Materials and Structures · 23
2014 · T. Vu-Cong, N. Nguyen-Thi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 19
2013 · T. Vu-Cong, C. Jean-Mistral, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2021 · T. Vu-Cong, M. Dalstein, et al. · IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) · 11
2020 · E. Ouss, A. Beroual, et al. · IEEE Transactions on Dielectrics and Electrical Insulation · 11
2023 · Christian Mier Escurra, Abderrahim Khamlichi, et al. · IEEE Sensors Journal · 10
2014 · C. Jean-Mistral, M. Beaune, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2016 · L. Zavattoni, C-T. Vu, et al. · IEEE International Conference on Dielectrics (ICD) · 7
2014 · C. Jean-Mistral, T. Porter, et al. · IEEE/ASME International Conference on Advanced Intelligent Mechatronics · 7
2012 · C. Jean-Mistral, T. Vu Cong, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2020 · T. Vu-Cong, C. Toigo, et al. · IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) · 4
2024 · Ayyoub Zouaghi, Caterina Toigo, et al. · IEEE International Conference on Dielectrics (ICD) · 3
2022 · A. Perez, T. Vu-Cong, et al. · IEEE International Conference on High Voltage Engineering and Application (ICHVE) · 3
2022 · C. Toigo, A. Perez, et al. · IEEE International Conference on Dielectrics (ICD) · 3
2022 · M. Dalstein, M. Medlock, et al. · IEEE International Conference on Dielectrics (ICD) · 3
2019 · T. Vu-Cong, F. Jacquier, et al. · IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) · 3
2015 · Vu, Cong Thanh, Beroual, Abderrahmane, et al. · HAL · 2
2020 · C. Toigo, T. Vu-Cong, et al. · IEEE International Conference on Dielectrics (ICD) · 1
Works count: 46
Citation count: 507
H-index: 11
I10-index: 13
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