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Author

Gabin An

Observed name: An, Gabin
Institution: Korea University
ORCID: 0000-0002-6521-8858
Observed ORCID: 0000-0002-6521-8858
OpenAlex ID: A5048573106
A Quantitative and Qualitative Evaluation of LLM-Based Explainable Fault Localization
2024 · Sungmin Kang, Gabin An, et al. · Proceedings of the ACM on software engineering. · 212
PyGGI 2.0: language independent genetic improvement framework
2019 · Gabin An, Aymeric Blot, et al. · ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) · 28
Fonte: Finding Bug Inducing Commits from Failures
2023 · Gabin An, Jingun Hong, et al. · ACM/IEEE International Conference on Software Engineering: Companion Proceedings (ICSE-Companion) · 24
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Iterative Refactoring of Real-World Open-Source Programs with Large Language Models
2024 · Jinsu Choi, Gabin An, et al. · Lecture notes in computer science · 16
Searching for Multi-fault Programs in Defects4J
2021 · Gabin An, Juyeon Yoon, et al. · Lecture notes in computer science · 15
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Reducing the search space of bug inducing commits using failure coverage
2021 · Gabin An, Shin Yoo · ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) · 14
Comparing line and AST granularity level for program repair using P y GGI
2018 · Gabin An, Jinhan Kim, et al. · 14
BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++
2023 · Gabin An, Minhyuk Kwon, et al. · IEEE/ACM International Conference on Automated Software Engineering (ASE) · 12
Ahead of Time Mutation Based Fault Localisation using Statistical Inference
2021 · Jinhan Kim, Gabin An, et al. · Proceedings/Proceedings - International Symposium on Software Reliability Engineering · 10
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Metamon: Finding Inconsistencies between Program Documentation and Behavior using Metamorphic LLM Queries
2025 · Hyeonseok Lee, Gabin An, et al. · International Workshop on Large Language Models for Code (LLM4Code) · 8
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FDG: a precise measurement of fault diagnosability gain of test cases
2022 · Gabin An, Shin Yoo · ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA) · 8
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Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA
2022 · Gabin An, Juyeon Yoon, et al. · IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) · 8
Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study
2021 · Jeongju Sohn, Gabin An, et al. · IEEE International Conference on Software Testing, Verification and Validation (ICST) · 8
Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching
2024 · Gabin An, Juyeon Yoon, et al. · IEEE International Conference on Software Maintenance (ICSM) · 7
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Learning test-mutant relationship for accurate fault localisation
2023 · Jinhan Kim, Gabin An, et al. · Information and Software Technology · 7
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COSMosFL: Ensemble of Small Language Models for Fault Localisation
2025 · Hyunjoon Cho, Sungmin Kang, et al. · International Workshop on Large Language Models for Code (LLM4Code) · 5
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Lachesis: Predicting LLM Inference Accuracy using Structural Properties of Reasoning Paths
2025 · Naryeong Kim, Sungmin Kang, et al. · IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest) · 4
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Evaluating Machine Learning-Based Test Case Prioritization in the Real World: An Experiment with SAP HANA
2025 · Jeongki Son, Gabin An, et al. · IEEE International Conference on Software Testing, Verification and Validation (ICST) · 4
Human-in-the-Loop Fault Localisation Using Efficient Test Prioritisation of Generated Tests.
2021 · Gabin An, Shin Yoo · arXiv (Cornell University) · 4
Is Three the Magic Number? An Empirical Evaluation of LLM-Based Repair Loops
2026 · Tobias Kiecker, Eik Reichmann, et al. · IEEE/ACM International Conference on Automated Software Engineering (ASE) · 2
Finding the Needle in the Crash Stack: Industrial-Scale Crash Root Cause Localization with AutoCrashFL
2026 · Sungmin Kang, Sumi Yun, et al. · IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) · 2
The 13th International Workshop on Genetic Improvement(GI @ ICSE 2024)
2024 · William B. Langdon, Gabin An, et al. · ACM SIGSOFT Software Engineering Notes · 2
Improving Test Distance for Failure Clustering with Hypergraph Modelling
2021 · An, Gabin, Yoon, Juyeon, et al. · arXiv (Cornell University) · 2
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Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference.
2019 · Jin-Han Kim, Gabin An, et al. · arXiv (Cornell University) · 2
Evaluation Code for: Disassembly-Augmented Root Cause Analysis for C/C++ Segmentation Faults
2026 · Jung, Jihoon, You, Chansong, et al. · Zenodo (CERN European Organization for Nuclear Research) · 1
Works count: 41
Citation count: 423
H-index: 9
I10-index: 9
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