Get started
Author

Jizuo Zhang

The Effect of Deep N+ Well on Single-Event Transient in 65 nm Triple-Well NMOSFET
2019 · Jizuo Zhang, Jianjun Chen, et al. · Symmetry · 8
PDF
Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM
2018 · Cheng Xie, Yueyue Chen, et al. · Science China Information Sciences · 8
Single Event Transient Study of pMOS Transistors in 65 nm Technology With and Without a Deep n+ Well Under Particle Striking
2019 · Jizuo Zhang, Liang Fang, et al. · IEEE Access · 5
Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology
2018 · Jizuo Zhang, Jianjun Chen, et al. · Microelectronics Reliability · 4
A multiloop ring VCO design in 0.18µm CMOS technology
2010 · Jihai Duan, Zhilan He, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 3
Characterization of Single Event Effect in a Radiation Hardened Programmable Read-Only Memory in a 130 nm Bulk CMOS Technology
2023 · Guoqing Yang, Jizuo Zhang, et al. · Journal of Nanoelectronics and Optoelectronics · 2
A 12.5-Gb/s Equalizer with CTLE and a 4-Tap Quarter-Rate DFE in 40 nm Technology
2019 · Qing Xu, Jianjun Chen, et al. · Communications in computer and information science · 2
A 1.2V 12 Bits SAR ADC with a Two Stages Amplifier Full-scale Differential Dynamic Comparator
2018 · Shouping Li, Yang Guo, et al. · International Conference on Communications, Circuits and Systems · 2
Evaluation of Single-Event Upsets in SRAM in 22 nm Fully Depleted Silicon in an Insulator Integrated Circuit Process
2026 · Xinyi Yan, Jizuo Zhang, et al. · Symmetry
Voltage-Controlled Skyrmion Breathing Mode for Reservoir Computing
2025 · Shan Qiu, Jiahao Liu, et al. · IEEE Electron Device Letters
Comparative Analysis of Single Event Upsets in 28 nm and 40 nm SRAM Under Aluminum, Oxygen, Lithium, and Hydrogen Ion Irradiation
2025 · Jizuo Zhang, Yun Cheng, et al. · Journal of Nanoelectronics and Optoelectronics
The Comparison of Single Event Upset Performance in Static Random-Access Memory for 28 nm and 65 nm Integrated Circuit Processes
2025 · Jizuo Zhang, Yun Cheng, et al. · Journal of Nanoelectronics and Optoelectronics
A CMOS bandgap voltage reference source for audio ∑-ΔA/D converter
2012 · Jizuo Zhang · Electronic Design Engineering
zhong shou yao yan jiu kai fa suo mian lin de tiao zhan
2005 · Jianyong Li, Zhang Jizuo, et al. · Heilongjiang xumu shouyi
Works count: 14
Citation count: 34
H-index: 4
I10-index:
Year
Topic
Type