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Lucia Spasevski

Observed names: L. Spasevski, Spasevski, Lucia
ORCID: 0000-0002-7409-3807
Observed ORCID: 0000-0002-7409-3807
OpenAlex ID: A5049330889
GaN/AlGaN multiple quantum wells grown on transparent and conductive (-201)-oriented β-Ga2O3 substrate for UV vertical light emitting devices
2018 · I. A. Ajia, Y. Yamashita, et al. · Applied Physics Letters · 51
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Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films
2019 · C. Trager-Cowan, A. Alasmari, et al. · Photonics Research · 13
A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content
2020 · Lucia Spasevski, Gunnar Kusch, et al. · Journal of Physics D Applied Physics · 12
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Indium incorporation in quaternary In x Al y Ga 1− x − y N for UVB-LEDs
2019 · Johannes Enslin, Tim Wernicke, et al. · Japanese Journal of Applied Physics · 5
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Challenges in measuring low concentration of overlapping elements with EDS and the need for verification with secondary standard composition
2026 · Lucia Spasevski, Philippe T. Pinard, et al. · EPJ Web of Conferences · 4
Quantification of Trace-Level Silicon Doping in Al x Ga 1– x N Films Using Wavelength-Dispersive X-Ray Microanalysis
2021 · Lucia Spasevski, Ben Buse, et al. · Microscopy and Microanalysis · 4
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Challenges in Measuring Low Concentration of Overlapping Elements with EDS and Need for Verification with Standard Materials
2025 · Lucia Spasevski, Simon Burgess, et al. · Microscopy and Microanalysis · 3
Influence of InN and AlN concentration on the compositional inhomogeneity and formation of InN-rich regions in InxAlyGa1−x−yN
2019 · Gunnar Kusch, Johannes Enslin, et al. · Japanese Journal of Applied Physics · 3
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Excitons in PL Spectra of Cu(In,Ga)Se2 Single Crystals
2019 · E. Skidchenko, M. V. Yakushev, et al. · Physics of the Solid State · 2
Measuring nanograins of 50nm-thick metallization layer using a new approach of EBSD pattern matching
2023 · Jiang Wu, Eugene Choo, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 1
You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization
2018 · Paul R. Edwards, G. Naresh-Kumar, et al. · Microscopy and Microanalysis · 1
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Advanced Elemental Analysis in Biology Using Cutting Edge SEM-BEX and EDS Technology
2026 · Haithem Mansour, Yin Chang, et al. · Microscopy and Microanalysis
Small Features, Big Impact: Accurate Nanoscale Chemical Characterization with EDS for Real-World Biological and Semiconductor Problem Solving
2026 · Lucia Spasevski, Simon Burgess, et al. · Microscopy and Microanalysis
Challenges in measuring low concentration of overlapping elements with EDS and the need for verification with secondary standard composition
2026 · Lucia Spasevski, Philippe T. Pinard, et al. · Springer Link (Chiba Institute of Technology)
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Advances in Individual Detector Characterization and Key Parameters that Affect Modern EDS Performance
2025 · Lucia Spasevski, Simon Burgess, et al. · Microscopy and Microanalysis
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Modern SEM-EDS Systems Explained – What is Cutting Edge Technology Today?
2025 · Simon Burgess, Lucia Spasevski, et al.
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State of the Art SEM-based, Electron, X-ray and Raman Imaging and Analysis Reveals Century Old Secrets: Case of a 19th Century Wooden Inventory
2024 · Lucia Spasevski, Domagoj Mudronja, et al. · Microscopy and Microanalysis
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Examination of the Thermal and Morphological properties of Spartium Junceum Fibers for Flame Retardant Purposes
2024 · Zorana Kovacevic, Lucia Spasevski, et al. · BIO Web of Conferences
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Battery Materials: In-Situ Analysis with the Scanning Electron Microscope
2023 · Alexandra Stavropoulou, Lucia Spasevski, et al. · ECS Meeting Abstracts
Use of Spectrum Simulation to Acquire Reliable Scans with a Wavelength Dispersive Spectrometer
2023 · Philippe Pinard, Rosie Jones, et al. · Microscopy and Microanalysis
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Excitons in PL spectra of Cu(In, Ga)Se-=SUB=-2-=/SUB=- single crystal -=SUP=-*-=/SUP=-
2019 · E. Skidchenko, M.V. Yakushev, et al. · Physics of the Solid State
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Works count: 24
Citation count: 99
H-index: 4
I10-index: 3
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