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Yuwei Zhai

Observed names: Yu-wei Zhai, Zhai Yu-wei, Zhai Yuwei
ORCID: 0000-0003-4899-1651
Observed ORCID: 0000-0003-4899-1651
OpenAlex ID: A5049495877
Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection
2023 · Xianwei Meng, Meng Zhang, et al. · IEEE Transactions on Instrumentation and Measurement · 13
Quantum genetic algorithm assisted high speed and precision pump-probe thermoreflectance characterization of micro-/nano-structures
2024 · Yongze Xu, Yang He, et al. · International Journal of Heat and Mass Transfer · 12
Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope
2016 · Yuwei Zhai, Faguo Liang, et al. · Microelectronics Reliability · 4
Thermoreflectance property of gallium nitride
2024 · Yusa Chen, Meizhang Wu, et al. · Microelectronics Journal · 2
The Intrinsic Thermoreflectance Property of 4H-SiC
2021 · Yusa Chen, Yun Huang, et al. · Journal of Electronic Materials · 2
Research on the Verification Method of the Agilent B1505A Semiconductor Device Analyzer
2013 · Qiao Yu-e, Liang Fa-guo, et al. · International Conference on Instrumentation and Measurement, Computer, Communication and Control (IMCCC) · 2
Thermoreflectance Study of GaAs and GaAs Passivated by the Method of Plasma Enhanced Chemical Vapor Deposition
2022 · Yu-sa Chen, Sheng-xiao Jin, et al. · Science of Advanced Materials · 1
Ways to Improve Temperature Measurement Accuracy of InfraScope Thermal Mapper
2013 · Zhai Yuwei, Liang Faguo, et al. · International Conference on Instrumentation and Measurement, Computer, Communication and Control (IMCCC)
Works count: 8
Citation count: 36
H-index: 3
I10-index: 2
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