Author

Sadakazu Wakui

Observed name: Wakui, Sadakazu

Institution: Nichia Corporation (Japan)

Observed institutions: Utrecht University, University of Electro-Communications, Nichia Corporation (Japan)

ORCID: 0000-0002-1183-6941

Observed ORCID: 0000-0002-1183-6941

OpenAlex ID: A5049864949

Luminescence and Formation of Cubic and Hexagonal (K,Rb)2SiF6:Mn4+

2023 · Arnoldus J. van Bunningen, Jur W. de Wit, et al. · ACS Applied Materials & Interfaces · 20

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Temperature quenching of Cr3+ in ASc(Si1-xGex)2O6 (A=Li/Na) solid solutions

2022 · Arnoldus J. van Bunningen, Atul D. Sontakke, et al. · Optical Materials · 16

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Atomic scale dielectric constant near the SiO2/Si(001) interface

2008 · Sadakazu Wakui, Jun Nakamura, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 16

First-principles calculations of dielectric constants for ultrathin SiO2 films

2006 · Sadakazu Wakui, Jun Nakamura, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 10

Mn 2+ activated Ca-α-SiAlON – broadband deep-red luminescence and sensitization by Eu 2+ , Yb 2+ and Ce 3+

2021 · Atul D. Sontakke, Arnoldus J. van Bunningen, et al. · Materials Advances · 7

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In-plane strain effects on dielectric properties of the HfO2 thin film

2009 · Sadakazu Wakui, Jun Nakamura, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6

Dielectric Properties of the Interface between Si and SiO 2

2007 · Sadakazu Wakui, Jun Nakamura, et al. · Japanese Journal of Applied Physics · 6

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First-principles evaluations of dielectric constants

2006 · Jun Nakamura, Sadakazu Wakui, et al. · International Workshop on Nano CMOS (IWNC) · 2

UCr 4 C 4 ‐Type RbLi(Li 3 SiO 4 ) 2 : A New Solid Electrolyte Framework for Fast Li‐Ion Conduction

2026 · Akihide Ichikawa, Sadakazu Wakui, et al. · Advanced Functional Materials

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Method for Evaluating the Spatial Distribution of Dielectric Constants: Application to Hydrogenated C(111) and Si(111) Surfaces

2026 · Hayato Kobayashi, Sadakazu Wakui, et al. · ACS Omega

ナノスケール誘電特性評価手法の開発とその半導体/酸化物薄膜界面系への応用

2010 · Wakui, Sadakazu · Institutional Repositories DataBase (IRDB)